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  • 2012

    Electronic surface properties of semiconductor surfaces and interfaces

    Shikler, R., 12 Dec 2012, Kelvin Probe Force Microscopy - Measuring and Compensating Electrostatic Forces. Sadewasser, S. & Glatzel, T. (eds.). 1 ed. p. 101-115 15 p. (Springer Series in Surface Sciences; vol. 48, no. 1).

    Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review