Keyphrases
Adsorption
9%
Aliphatic Chains
10%
CdTe Quantum Dots
9%
Coarsening Processes
9%
Coupling Mechanism
8%
CuInSe2
11%
Current Fluctuations
9%
Current Noise
8%
Dangling Bonds
13%
Dienes
9%
Elastic Field
11%
Electric Field (E-field)
8%
Electromigration
11%
Electron Spin
26%
Electron Spin Resonance
69%
Hydrides
9%
Larmor Frequency
22%
Magnetic Resonance
8%
Microscopic Techniques
13%
Multilayer Quantum Dot
11%
Noise Spectroscopy
13%
Nuclear Spin
11%
Paramagnetic Molecules
8%
Power Spectrum
9%
Precession
9%
Precession Frequency
14%
Quantum Dots
17%
Resonant Scanning
34%
Scanning Probe Microscopy
17%
Scanning Tunneling Microscope
57%
Scanning Tunneling Microscopy
100%
Semiconductors
14%
Short-range Order
11%
Si(111)
51%
Si(111) Surface
13%
Silicon Surface
9%
Single Atom
13%
Single Spin
36%
Single Spin Detection
11%
Solid Phase Epitaxy
11%
Spin Centers
15%
Spin Noise
39%
Spin-orbit Coupling
11%
Submonolayer
9%
Thermally Assisted
8%
Transistor Structure
11%
Tunneling
19%
Tunneling Barrier
8%
Tunneling Current
39%
Tunneling Electron
23%
Engineering
Adsorption
12%
Atomic Force Microscope
5%
Atomic Layer
5%
Dangling Bond
14%
Deep Hole
5%
Defects
9%
Dependent Strain
5%
Diamond
5%
Displacement Measurement
5%
Driving Force
5%
Dynamic Nature
5%
Elastic Energy
9%
Elastic Field
5%
Elastic Interaction
7%
Electric Field
5%
Electromigration
11%
Energy Surface
5%
Frequency Signal
5%
Good Correlation
5%
High Electric Field
5%
Hydride Phase
5%
Interaction Energy
5%
Iron Atom
5%
Josephson Junction
5%
Model Chain
5%
Nanoparticle
5%
Number Density
5%
Phase Delay
5%
Quantum Dot
17%
Range Order
11%
Room Temperature
7%
Scanning Probe Microscopy
5%
Scanning Tunneling Microscope
28%
Scanning Tunneling Microscopy
98%
Semiconductor Nanostructures
5%
Site Selection
5%
Strain Map
5%
Substrate Interface
5%
Surface Site
5%
Surface Topography
5%
Thin Films
7%
Tunnel Construction
33%
Young's Modulus
5%