A Comprehensive Evaluation of Power Delivery Schemes for Modern Microprocessors

Jawad Haj-Yahya, Efraim Rotem, Avi Mendelson, Anupam Chattopadhyay

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

10 Scopus citations

Abstract

The continuous quest for energy-efficient computing has led towards the adoption of fine-grained controls in processor sub-systems, of which power delivery network is the most prominent one. Recent industry trends reflect a shift towards on-chip, integrated voltage regulator (IVRs) to that effect. We undertake a thorough and quantitative evaluation of different power delivery networks for modern microprocessors. In contrast to the current trend, we conclude that IVR schemes perform worse compared to the conventional off-chip voltage regulator scheme. Further, we present studies on diverse workloads and Thermal Design Points (TDPs) to highlight the importance of workload-specific power delivery scheme. To the best of our knowledge, this is the first comprehensive study across processors' TDPs and workloads.

Original languageEnglish
Title of host publicationProceedings of the 20th International Symposium on Quality Electronic Design, ISQED 2019
PublisherInstitute of Electrical and Electronics Engineers
Pages123-130
Number of pages8
ISBN (Electronic)9781728103921
DOIs
StatePublished - 23 Apr 2019
Externally publishedYes
Event20th International Symposium on Quality Electronic Design, ISQED 2019 - Santa Clara, United States
Duration: 6 Mar 20197 Mar 2019

Publication series

NameProceedings - International Symposium on Quality Electronic Design, ISQED
Volume2019-March
ISSN (Print)1948-3287
ISSN (Electronic)1948-3295

Conference

Conference20th International Symposium on Quality Electronic Design, ISQED 2019
Country/TerritoryUnited States
CitySanta Clara
Period6/03/197/03/19

Keywords

  • Energy-Efficiency
  • FIVR
  • Integrated Voltage Regulator
  • MBVR
  • Power Delivery

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality

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