A method of determining minority carrier lifetime and doping level profiles of low-doped metal-oxide-semiconductor structures using pulsed photoinjection

U. Efron, J. Grinberg

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Fingerprint

Dive into the research topics of 'A method of determining minority carrier lifetime and doping level profiles of low-doped metal-oxide-semiconductor structures using pulsed photoinjection'. Together they form a unique fingerprint.

Physics & Astronomy