TY - GEN
T1 - A Novel Approach for Measurement of Source Code Similarity
AU - Agrawal, Mayank
AU - Jain, Vinod
AU - Uttam, Atul Kumar
N1 - Publisher Copyright:
© 2020 IEEE.
PY - 2020/6/1
Y1 - 2020/6/1
N2 - Plagiarism is really a matter of concern. Plagiarism detection is a major issue while detecting at various levels. Finding plagiarism in source codes that can either be written in same language or different language, increases the complexity of plagiarism detection. People dealing with software designing and academic works are majorly affected by the plagiarism. In this paper we present a novel approach for measurement of code similarity to detect similarity between codes. With the help of the proposed approach, by using methods and functions we can compare the two source codes. This will lead to fair evaluation of assignments, as with the help of this tool we can easily detect Programming Assignment and copying of codes or function.
AB - Plagiarism is really a matter of concern. Plagiarism detection is a major issue while detecting at various levels. Finding plagiarism in source codes that can either be written in same language or different language, increases the complexity of plagiarism detection. People dealing with software designing and academic works are majorly affected by the plagiarism. In this paper we present a novel approach for measurement of code similarity to detect similarity between codes. With the help of the proposed approach, by using methods and functions we can compare the two source codes. This will lead to fair evaluation of assignments, as with the help of this tool we can easily detect Programming Assignment and copying of codes or function.
KW - Plagiarism
KW - Plagiarism detection tool
KW - Similarity detection
KW - Source code plagiarism
UR - http://www.scopus.com/inward/record.url?scp=85093085864&partnerID=8YFLogxK
U2 - 10.1109/ICRITO48877.2020.9197972
DO - 10.1109/ICRITO48877.2020.9197972
M3 - Conference contribution
AN - SCOPUS:85093085864
T3 - ICRITO 2020 - IEEE 8th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions)
SP - 125
EP - 128
BT - ICRITO 2020 - IEEE 8th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions)
PB - Institute of Electrical and Electronics Engineers
T2 - 8th IEEE International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions), ICRITO 2020
Y2 - 4 June 2020 through 5 June 2020
ER -