A novel inspection system for variable data printing using deep learning

Oren Haik, Oded Perry, Eli Chen, Peter Klammer

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

We present a novel approach for inspecting variable data prints (VDP) with an ultra-low false alarm rate (0.005%) and potential applicability to other real-world problems. The system is based on a comparison between two images: a reference image and an image captured by low-cost scanners. The comparison task is challenging as low-cost imaging systems create artifacts that may erroneously be classified as true (genuine) defects. To address this challenge we introduce two new fusion methods, for change detection applications, which are both fast and efficient. The first is an early fusion method that combines the two input images into a single pseudo-color image. The second, called Change-Detection Single Shot Detector (CD-SSD) leverages the SSD by fusing features in the middle of the network. We demonstrate the effectiveness of the proposed deep learning-based approach with a large dataset from real-world printing scenarios. Finally, we evaluate our models on a different domain of aerial imagery change detection (AICD). Our best method clearly outperforms the state-of-the-art baseline on this dataset.

Original languageEnglish
Title of host publicationProceedings - 2020 IEEE Winter Conference on Applications of Computer Vision, WACV 2020
PublisherInstitute of Electrical and Electronics Engineers
Pages3530-3539
Number of pages10
ISBN (Electronic)9781728165530
DOIs
StatePublished - 1 Mar 2020
Externally publishedYes
Event2020 IEEE/CVF Winter Conference on Applications of Computer Vision, WACV 2020 - Snowmass Village, United States
Duration: 1 Mar 20205 Mar 2020

Publication series

NameProceedings - 2020 IEEE Winter Conference on Applications of Computer Vision, WACV 2020

Conference

Conference2020 IEEE/CVF Winter Conference on Applications of Computer Vision, WACV 2020
Country/TerritoryUnited States
CitySnowmass Village
Period1/03/205/03/20

ASJC Scopus subject areas

  • Computer Science Applications
  • Computer Vision and Pattern Recognition

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