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A pattern recognition method to detect vulnerable spots in an RNA sequence for bacterial resistance to the antibiotic spectinomycin

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    Abstract

    This paper describes an efficient pattern recognition method for detecting vulnerable spots within an RNA sequence. Mutations in these spots may lead to a structural change that directly relates to a change in functionality. Previously, the concept was tried on RNA genetic control elements called 'riboswitches' and other known RNA switches. Here, the concept is extended to assist in planning in-vivo experiments in general, using a new tool that we have developed called RNAMute. We apply the package RNAMute on an RNA transcript that was shown experimentally to inactivate spectinomycin resistance in Escherichia coli by creating a library of point mutations using PCR and screening to locate those mutations. Our prediction, conducted independently of the known experimental results, succeeds in matching the inactivating point mutations that were obtained by the selection experiment. Validation of the method with data available from laboratory experiment supports its use as a general predictive tool.

    Original languageEnglish
    Title of host publication2005 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR 2005 - Workshops
    PublisherInstitute of Electrical and Electronics Engineers
    ISBN (Electronic)0769526608
    DOIs
    StatePublished - 1 Jan 2005
    Event2005 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR 2005 - Workshops - San Diego, United States
    Duration: 21 Sep 200523 Sep 2005

    Publication series

    NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
    Volume2005-September
    ISSN (Print)2160-7508
    ISSN (Electronic)2160-7516

    Conference

    Conference2005 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR 2005 - Workshops
    Country/TerritoryUnited States
    CitySan Diego
    Period21/09/0523/09/05

    ASJC Scopus subject areas

    • Computer Vision and Pattern Recognition
    • Electrical and Electronic Engineering

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