A random access photodiode array for intelligent image capture

Orly Yadid-Pecht; Ran Ginosar; Yosi Shacham-Diamand

doi:10.1109/EEIS.1991.217637

A random access photodiode array for intelligent image capture

Orly Yadid-Pecht, Ran Ginosar, Yosi Shacham-Diamand

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Scopus citations

Abstract

A novel chip implementing random scan was designed, fabricated and tested. The chip covers the basic requirements for random access and separation between the sampling and reading processes. In this way a repeated reading of any pixel at any time can take place. The chip includes an 80 × 80 matrix of basic cells. Each cell consists of two stages: the first is based on a switch while the second includes a buffer. The chip was fabricated in a 3μ CMOS process. It was found to operate functionally. However, the use of a standard process gave rise to the crosstalk phenomenon which has yet to be overcome.

Original language	English
Title of host publication	Proceedings - 17th Convention of Electrical and Electronics Engineers in Israel, EEIS 1991
Publisher	Institute of Electrical and Electronics Engineers
Pages	301-304
Number of pages	4
ISBN (Electronic)	0879426780, 9780879426781
DOIs	https://doi.org/10.1109/EEIS.1991.217637
State	Published - 1 Jan 1991
Externally published	Yes
Event	17th Convention of Electrical and Electronics Engineers in Israel, EEIS 1991 - Tel Aviv, Israel Duration: 5 Mar 1991 → 7 Mar 1991

Publication series

Name	Proceedings - 17th Convention of Electrical and Electronics Engineers in Israel, EEIS 1991

Conference

Conference	17th Convention of Electrical and Electronics Engineers in Israel, EEIS 1991
Country/Territory	Israel
City	Tel Aviv
Period	5/03/91 → 7/03/91

ASJC Scopus subject areas

Electrical and Electronic Engineering

Access to Document

10.1109/EEIS.1991.217637

Cite this

Yadid-Pecht, O., Ginosar, R., & Shacham-Diamand, Y. (1991). A random access photodiode array for intelligent image capture. In Proceedings - 17th Convention of Electrical and Electronics Engineers in Israel, EEIS 1991 (pp. 301-304). Article 217637 (Proceedings - 17th Convention of Electrical and Electronics Engineers in Israel, EEIS 1991). Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/EEIS.1991.217637

Yadid-Pecht, Orly ; Ginosar, Ran ; Shacham-Diamand, Yosi. / A random access photodiode array for intelligent image capture. Proceedings - 17th Convention of Electrical and Electronics Engineers in Israel, EEIS 1991. Institute of Electrical and Electronics Engineers, 1991. pp. 301-304 (Proceedings - 17th Convention of Electrical and Electronics Engineers in Israel, EEIS 1991).

@inproceedings{77508871d95b4457a4f190549a6f0f36,

title = "A random access photodiode array for intelligent image capture",

abstract = "A novel chip implementing random scan was designed, fabricated and tested. The chip covers the basic requirements for random access and separation between the sampling and reading processes. In this way a repeated reading of any pixel at any time can take place. The chip includes an 80 × 80 matrix of basic cells. Each cell consists of two stages: the first is based on a switch while the second includes a buffer. The chip was fabricated in a 3μ CMOS process. It was found to operate functionally. However, the use of a standard process gave rise to the crosstalk phenomenon which has yet to be overcome.",

author = "Orly Yadid-Pecht and Ran Ginosar and Yosi Shacham-Diamand",

note = "Publisher Copyright: {\textcopyright} Proceedings - 17th Convention of Electrical and Electronics Engineers in Israel, EEIS 1991. All rights reserved.; 17th Convention of Electrical and Electronics Engineers in Israel, EEIS 1991 ; Conference date: 05-03-1991 Through 07-03-1991",

year = "1991",

month = jan,

day = "1",

doi = "10.1109/EEIS.1991.217637",

language = "English",

series = "Proceedings - 17th Convention of Electrical and Electronics Engineers in Israel, EEIS 1991",

publisher = "Institute of Electrical and Electronics Engineers",

pages = "301--304",

booktitle = "Proceedings - 17th Convention of Electrical and Electronics Engineers in Israel, EEIS 1991",

address = "United States",

}

Yadid-Pecht, O, Ginosar, R & Shacham-Diamand, Y 1991, A random access photodiode array for intelligent image capture. in Proceedings - 17th Convention of Electrical and Electronics Engineers in Israel, EEIS 1991., 217637, Proceedings - 17th Convention of Electrical and Electronics Engineers in Israel, EEIS 1991, Institute of Electrical and Electronics Engineers, pp. 301-304, 17th Convention of Electrical and Electronics Engineers in Israel, EEIS 1991, Tel Aviv, Israel, 5/03/91. https://doi.org/10.1109/EEIS.1991.217637

A random access photodiode array for intelligent image capture. / Yadid-Pecht, Orly; Ginosar, Ran; Shacham-Diamand, Yosi.
Proceedings - 17th Convention of Electrical and Electronics Engineers in Israel, EEIS 1991. Institute of Electrical and Electronics Engineers, 1991. p. 301-304 217637 (Proceedings - 17th Convention of Electrical and Electronics Engineers in Israel, EEIS 1991).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - A random access photodiode array for intelligent image capture

AU - Yadid-Pecht, Orly

AU - Ginosar, Ran

AU - Shacham-Diamand, Yosi

PY - 1991/1/1

Y1 - 1991/1/1

N2 - A novel chip implementing random scan was designed, fabricated and tested. The chip covers the basic requirements for random access and separation between the sampling and reading processes. In this way a repeated reading of any pixel at any time can take place. The chip includes an 80 × 80 matrix of basic cells. Each cell consists of two stages: the first is based on a switch while the second includes a buffer. The chip was fabricated in a 3μ CMOS process. It was found to operate functionally. However, the use of a standard process gave rise to the crosstalk phenomenon which has yet to be overcome.

AB - A novel chip implementing random scan was designed, fabricated and tested. The chip covers the basic requirements for random access and separation between the sampling and reading processes. In this way a repeated reading of any pixel at any time can take place. The chip includes an 80 × 80 matrix of basic cells. Each cell consists of two stages: the first is based on a switch while the second includes a buffer. The chip was fabricated in a 3μ CMOS process. It was found to operate functionally. However, the use of a standard process gave rise to the crosstalk phenomenon which has yet to be overcome.

UR - http://www.scopus.com/inward/record.url?scp=84963722329&partnerID=8YFLogxK

U2 - 10.1109/EEIS.1991.217637

DO - 10.1109/EEIS.1991.217637

M3 - Conference contribution

AN - SCOPUS:84963722329

T3 - Proceedings - 17th Convention of Electrical and Electronics Engineers in Israel, EEIS 1991

SP - 301

EP - 304

BT - Proceedings - 17th Convention of Electrical and Electronics Engineers in Israel, EEIS 1991

PB - Institute of Electrical and Electronics Engineers

T2 - 17th Convention of Electrical and Electronics Engineers in Israel, EEIS 1991

Y2 - 5 March 1991 through 7 March 1991

ER -

Yadid-Pecht O, Ginosar R, Shacham-Diamand Y. A random access photodiode array for intelligent image capture. In Proceedings - 17th Convention of Electrical and Electronics Engineers in Israel, EEIS 1991. Institute of Electrical and Electronics Engineers. 1991. p. 301-304. 217637. (Proceedings - 17th Convention of Electrical and Electronics Engineers in Israel, EEIS 1991). doi: 10.1109/EEIS.1991.217637

A random access photodiode array for intelligent image capture

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