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A TEM structural study of thermal stability of magnetic tunnel junctions integrated with CMOS devices
V. K. Lazarov, A. Kohn, T. Uhrmann, T. Dimopoulos, H. Brückl, H. Achard, C. Baraduc, S. Vizzini, H. Oughaddou, B. Aufray, A. D'Avitaya
Research output: Contribution to journal › Article › peer-review
5
Scopus
citations