A Thermoelastic Failure Criterion at the Micron Scale in Electronic Devices

Keyphrases

• Electronic Devices 100%
• Thermoelastic 100%
• Failure Criterion 100%
• Micron-scale 100%
• Semiconductors 50%
• Insulator 50%
• Microelectronics 50%
• Engineering Problems 50%
• Layered Structure 50%
• Thermoelasticity 50%
• Multi-step Process 50%
• Life Engineering 50%

Engineering

• Failure Criterion 100%
• Microelectronics 50%
• Microscale 50%
• Real Life 50%
• Engineering Problem 50%
• Layered Structure 50%
• Chip Device 50%

Material Science

• Thermoelasticity 100%