A two-dimensional beam profile monitor based on residual gas ionization

D. Shapira; T. A. Lewis

doi:10.1109/23.903830

A two-dimensional beam profile monitor based on residual gas ionization

D. Shapira, T. A. Lewis

Research output: Contribution to journal › Conference article › peer-review

Abstract

A two-dimensional beam profile monitor based on tracking the ionization of the residual gas molecules in the evacuated beam pipe is described. Tracking in position and time of the ions and electrons produced in the ionization enables simultaneous position sampling in three dimensions. Special features which make it possible to sample very low beam currents were employed.

Original language	English
Pages (from-to)	1969-1973
Number of pages	5
Journal	IEEE Transactions on Nuclear Science
Volume	47
Issue number	6 II
DOIs	https://doi.org/10.1109/23.903830
State	Published - 1 Dec 2000
Externally published	Yes

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@article{495f4a86b4c6427c903a6286032e1894,

title = "A two-dimensional beam profile monitor based on residual gas ionization",

abstract = "A two-dimensional beam profile monitor based on tracking the ionization of the residual gas molecules in the evacuated beam pipe is described. Tracking in position and time of the ions and electrons produced in the ionization enables simultaneous position sampling in three dimensions. Special features which make it possible to sample very low beam currents were employed.",

author = "D. Shapira and Lewis, {T. A.}",

note = "Funding Information: Oak Ridge National Laboratory is managed by Lockheed Martin Energy Research Corp. for the U.S. Department of Energy under contract nUmber DE-AC05-960R22464.",

year = "2000",

month = dec,

day = "1",

doi = "10.1109/23.903830",

language = "English",

volume = "47",

pages = "1969--1973",

journal = "IEEE Transactions on Nuclear Science",

issn = "0018-9499",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "6 II",

}

TY - JOUR

T1 - A two-dimensional beam profile monitor based on residual gas ionization

AU - Shapira, D.

AU - Lewis, T. A.

N1 - Funding Information: Oak Ridge National Laboratory is managed by Lockheed Martin Energy Research Corp. for the U.S. Department of Energy under contract nUmber DE-AC05-960R22464.

PY - 2000/12/1

Y1 - 2000/12/1

N2 - A two-dimensional beam profile monitor based on tracking the ionization of the residual gas molecules in the evacuated beam pipe is described. Tracking in position and time of the ions and electrons produced in the ionization enables simultaneous position sampling in three dimensions. Special features which make it possible to sample very low beam currents were employed.

AB - A two-dimensional beam profile monitor based on tracking the ionization of the residual gas molecules in the evacuated beam pipe is described. Tracking in position and time of the ions and electrons produced in the ionization enables simultaneous position sampling in three dimensions. Special features which make it possible to sample very low beam currents were employed.

UR - http://www.scopus.com/inward/record.url?scp=0034451305&partnerID=8YFLogxK

U2 - 10.1109/23.903830

DO - 10.1109/23.903830

M3 - Conference article

AN - SCOPUS:0034451305

VL - 47

SP - 1969

EP - 1973

JO - IEEE Transactions on Nuclear Science

JF - IEEE Transactions on Nuclear Science

SN - 0018-9499

IS - 6 II

ER -

A two-dimensional beam profile monitor based on residual gas ionization

Abstract

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