Acceleration factor for ageing measurement of dye solar cells

Laura Ciammaruchi; Stefano Penna; Andrea Reale; Thomas M. Brown; Aldo Di Carlo

doi:10.1016/j.microrel.2012.08.016

Acceleration factor for ageing measurement of dye solar cells

Laura Ciammaruchi, Stefano Penna, Andrea Reale, Thomas M. Brown, Aldo Di Carlo

Research output: Contribution to journal › Article › peer-review

14 Scopus citations

Abstract

Three different temperatures are used to stress Dye-sensitized Solar Cells (DSCs) under 1 Sun irradiation in order to accelerate their ageing process. A linear degradation law for the efficiency data has been supposed, deduced from the experimental efficiency vs. time curves. Based on the Arrhenius model for first order kinetics, an acceleration factor has been extracted, depending on the device stress temperature. From the semi-logarithmic plot of the acceleration factor as a function of 1/T we could also calculate an activation energy of about 1 eV for the degrading process to be activated.

Original language	English
Pages (from-to)	279-281
Number of pages	3
Journal	Microelectronics Reliability
Volume	53
Issue number	2
DOIs	https://doi.org/10.1016/j.microrel.2012.08.016
State	Published - 1 Feb 2013
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Safety, Risk, Reliability and Quality
Condensed Matter Physics
Surfaces, Coatings and Films
Electrical and Electronic Engineering

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

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10.1016/j.microrel.2012.08.016

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title = "Acceleration factor for ageing measurement of dye solar cells",

abstract = "Three different temperatures are used to stress Dye-sensitized Solar Cells (DSCs) under 1 Sun irradiation in order to accelerate their ageing process. A linear degradation law for the efficiency data has been supposed, deduced from the experimental efficiency vs. time curves. Based on the Arrhenius model for first order kinetics, an acceleration factor has been extracted, depending on the device stress temperature. From the semi-logarithmic plot of the acceleration factor as a function of 1/T we could also calculate an activation energy of about 1 eV for the degrading process to be activated.",

author = "Laura Ciammaruchi and Stefano Penna and Andrea Reale and Brown, {Thomas M.} and {Di Carlo}, Aldo",

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doi = "10.1016/j.microrel.2012.08.016",

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T1 - Acceleration factor for ageing measurement of dye solar cells

AU - Ciammaruchi, Laura

AU - Penna, Stefano

AU - Reale, Andrea

AU - Brown, Thomas M.

AU - Di Carlo, Aldo

PY - 2013/2/1

Y1 - 2013/2/1

N2 - Three different temperatures are used to stress Dye-sensitized Solar Cells (DSCs) under 1 Sun irradiation in order to accelerate their ageing process. A linear degradation law for the efficiency data has been supposed, deduced from the experimental efficiency vs. time curves. Based on the Arrhenius model for first order kinetics, an acceleration factor has been extracted, depending on the device stress temperature. From the semi-logarithmic plot of the acceleration factor as a function of 1/T we could also calculate an activation energy of about 1 eV for the degrading process to be activated.

AB - Three different temperatures are used to stress Dye-sensitized Solar Cells (DSCs) under 1 Sun irradiation in order to accelerate their ageing process. A linear degradation law for the efficiency data has been supposed, deduced from the experimental efficiency vs. time curves. Based on the Arrhenius model for first order kinetics, an acceleration factor has been extracted, depending on the device stress temperature. From the semi-logarithmic plot of the acceleration factor as a function of 1/T we could also calculate an activation energy of about 1 eV for the degrading process to be activated.

UR - http://www.scopus.com/inward/record.url?scp=84873731639&partnerID=8YFLogxK

U2 - 10.1016/j.microrel.2012.08.016

DO - 10.1016/j.microrel.2012.08.016

M3 - Article

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EP - 281

JO - Microelectronics Reliability

JF - Microelectronics Reliability

IS - 2

ER -

Acceleration factor for ageing measurement of dye solar cells

Abstract

ASJC Scopus subject areas

UN SDGs

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