Achieving reduced cycle times in semiconductor manufacturing via effective control of the P-K equation factors

Adar Kalir; Sylvain Bouhnik

doi:10.3182/20060517-3-fr-2903.00041

Achieving reduced cycle times in semiconductor manufacturing via effective control of the P-K equation factors

Adar Kalir
, Sylvain Bouhnik

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Scopus citations

Abstract

In the current environment of flash semiconductor market, competitive cycle times are the key to success. Cycle Time (CT) reduction can be achieved by process time elimination and/or equipment performance improvement, but also by optimizing on the WIP management policy. In this paper, we discuss how significant CT reductions are attained via the effective change of parameter values of the governing WIP management policy of a semiconductor factory. A full factorial Design of Experiments (DOE) was performed, and several parameters were examined. The impact on the coefficient of variability of departure rate (C_DR) and CT was evaluated. Results have clearly shown that by changing the values of these parameters, significant cycle time reductions can be achieved.

Original language	English
Title of host publication	12th IFAC Symposium on Information Control Problems in Manufacturing, INCOM 2006, and Associated Industrial Meetings
Subtitle of host publication	EMM'2006, BPM'2006, JT'2006
Publisher	IFAC Secretariat
Edition	PART 1
ISBN (Print)	9783902661043
DOIs	https://doi.org/10.3182/20060517-3-fr-2903.00041
State	Published - 1 Jan 2006
Externally published	Yes

Publication series

Name	IFAC Proceedings Volumes (IFAC-PapersOnline)
Number	PART 1
Volume	12
ISSN (Print)	1474-6670

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 9 Industry, Innovation, and Infrastructure

Keywords

Cycle time
DOE
Simulation
Variability
WIP management

ASJC Scopus subject areas

Control and Systems Engineering

Access to Document

10.3182/20060517-3-fr-2903.00041

Cite this

Kalir, A., & Bouhnik, S. (2006). Achieving reduced cycle times in semiconductor manufacturing via effective control of the P-K equation factors. In 12th IFAC Symposium on Information Control Problems in Manufacturing, INCOM 2006, and Associated Industrial Meetings: EMM'2006, BPM'2006, JT'2006 (PART 1 ed.). (IFAC Proceedings Volumes (IFAC-PapersOnline); Vol. 12, No. PART 1). IFAC Secretariat. https://doi.org/10.3182/20060517-3-fr-2903.00041

Kalir, Adar ; Bouhnik, Sylvain. / Achieving reduced cycle times in semiconductor manufacturing via effective control of the P-K equation factors. 12th IFAC Symposium on Information Control Problems in Manufacturing, INCOM 2006, and Associated Industrial Meetings: EMM'2006, BPM'2006, JT'2006. PART 1. ed. IFAC Secretariat, 2006. (IFAC Proceedings Volumes (IFAC-PapersOnline); PART 1).

@inproceedings{c8f125f39bed466f8de4b19225c4c3e1,

title = "Achieving reduced cycle times in semiconductor manufacturing via effective control of the P-K equation factors",

abstract = "In the current environment of flash semiconductor market, competitive cycle times are the key to success. Cycle Time (CT) reduction can be achieved by process time elimination and/or equipment performance improvement, but also by optimizing on the WIP management policy. In this paper, we discuss how significant CT reductions are attained via the effective change of parameter values of the governing WIP management policy of a semiconductor factory. A full factorial Design of Experiments (DOE) was performed, and several parameters were examined. The impact on the coefficient of variability of departure rate (CDR) and CT was evaluated. Results have clearly shown that by changing the values of these parameters, significant cycle time reductions can be achieved.",

keywords = "Cycle time, DOE, Simulation, Variability, WIP management",

author = "Adar Kalir and Sylvain Bouhnik",

year = "2006",

month = jan,

day = "1",

doi = "10.3182/20060517-3-fr-2903.00041",

language = "English",

isbn = "9783902661043",

series = "IFAC Proceedings Volumes (IFAC-PapersOnline)",

publisher = "IFAC Secretariat",

number = "PART 1",

booktitle = "12th IFAC Symposium on Information Control Problems in Manufacturing, INCOM 2006, and Associated Industrial Meetings",

address = "Austria",

edition = "PART 1",

}

Kalir, A & Bouhnik, S 2006, Achieving reduced cycle times in semiconductor manufacturing via effective control of the P-K equation factors. in 12th IFAC Symposium on Information Control Problems in Manufacturing, INCOM 2006, and Associated Industrial Meetings: EMM'2006, BPM'2006, JT'2006. PART 1 edn, IFAC Proceedings Volumes (IFAC-PapersOnline), no. PART 1, vol. 12, IFAC Secretariat. https://doi.org/10.3182/20060517-3-fr-2903.00041

Achieving reduced cycle times in semiconductor manufacturing via effective control of the P-K equation factors. / Kalir, Adar; Bouhnik, Sylvain.
12th IFAC Symposium on Information Control Problems in Manufacturing, INCOM 2006, and Associated Industrial Meetings: EMM'2006, BPM'2006, JT'2006. PART 1. ed. IFAC Secretariat, 2006. (IFAC Proceedings Volumes (IFAC-PapersOnline); Vol. 12, No. PART 1).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Achieving reduced cycle times in semiconductor manufacturing via effective control of the P-K equation factors

AU - Kalir, Adar

AU - Bouhnik, Sylvain

PY - 2006/1/1

Y1 - 2006/1/1

N2 - In the current environment of flash semiconductor market, competitive cycle times are the key to success. Cycle Time (CT) reduction can be achieved by process time elimination and/or equipment performance improvement, but also by optimizing on the WIP management policy. In this paper, we discuss how significant CT reductions are attained via the effective change of parameter values of the governing WIP management policy of a semiconductor factory. A full factorial Design of Experiments (DOE) was performed, and several parameters were examined. The impact on the coefficient of variability of departure rate (CDR) and CT was evaluated. Results have clearly shown that by changing the values of these parameters, significant cycle time reductions can be achieved.

AB - In the current environment of flash semiconductor market, competitive cycle times are the key to success. Cycle Time (CT) reduction can be achieved by process time elimination and/or equipment performance improvement, but also by optimizing on the WIP management policy. In this paper, we discuss how significant CT reductions are attained via the effective change of parameter values of the governing WIP management policy of a semiconductor factory. A full factorial Design of Experiments (DOE) was performed, and several parameters were examined. The impact on the coefficient of variability of departure rate (CDR) and CT was evaluated. Results have clearly shown that by changing the values of these parameters, significant cycle time reductions can be achieved.

KW - Cycle time

KW - DOE

KW - Simulation

KW - Variability

KW - WIP management

UR - https://www.scopus.com/pages/publications/79961203078

U2 - 10.3182/20060517-3-fr-2903.00041

DO - 10.3182/20060517-3-fr-2903.00041

M3 - Conference contribution

AN - SCOPUS:79961203078

SN - 9783902661043

T3 - IFAC Proceedings Volumes (IFAC-PapersOnline)

BT - 12th IFAC Symposium on Information Control Problems in Manufacturing, INCOM 2006, and Associated Industrial Meetings

PB - IFAC Secretariat

ER -

Kalir A, Bouhnik S. Achieving reduced cycle times in semiconductor manufacturing via effective control of the P-K equation factors. In 12th IFAC Symposium on Information Control Problems in Manufacturing, INCOM 2006, and Associated Industrial Meetings: EMM'2006, BPM'2006, JT'2006. PART 1 ed. IFAC Secretariat. 2006. (IFAC Proceedings Volumes (IFAC-PapersOnline); PART 1). doi: 10.3182/20060517-3-fr-2903.00041

Achieving reduced cycle times in semiconductor manufacturing via effective control of the P-K equation factors

Abstract

Publication series

UN SDGs

Keywords

ASJC Scopus subject areas

Access to Document

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