Adsorption and interaction of Sb on Si (001) studied by scanning tunneling microscopy and core-level photoemission

DH Rich, FM Leibsle, A Samsavar, ES Hirschorn, T Miller, T-C Chiang

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70 Scopus citations

Abstract

Scanning tunneling microscopy (STM) and synchrotron photoemission were used to analyze the Sb/Si(001) interface formation for submonolayer and saturation coverages. The surface-shifted core-level component observed in photoemission for Si(001)-(2×1) was suppressed with the adsorption of Sb. Constant-current STM images which were taken for different sample bias conditions show changes in the spatial distribution of the occupied and unoccupied states derived from the Si-dimer dangling bonds upon Sb adsorption. These observations are interpreted in terms of the formation of Sb-Si bonds and the resulting modifications in the surface electronic properties.
Original languageEnglish GB
Pages (from-to)12758
Number of pages1
JournalPhysical Review B
Volume39
Issue number17
DOIs
StatePublished - 1989

ASJC Scopus subject areas

  • Condensed Matter Physics

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