Advanced methods for sub-pixel anomaly detection

Y. Cohen; S. R. Rotman

Advanced methods for sub-pixel anomaly detection

Y. Cohen, S. R. Rotman

Department of Electrical & Computer Engineering

Research output: Contribution to conference › Paper › peer-review

3 Scopus citations

Abstract

A new sub-pixel target detection algorithm is developed, integrating the powerful "RX" anomaly detector of Reed and Yu (1990), with segmentation and post-processing filters. The integrated method consistently outperforms spectral anomaly detectors based on RX alone. A novel approach is presented to deal with false alarms caused by edges.

Original language	English
Pages	432-435
Number of pages	4
State	Published - 1 Dec 2004
Event	2004 23rd IEEE Convention of Electrical and Electronics Engineers in Israel, Proceedings - Tel-Aviv, Israel Duration: 6 Sep 2004 → 7 Sep 2004

Conference

Conference	2004 23rd IEEE Convention of Electrical and Electronics Engineers in Israel, Proceedings
Country/Territory	Israel
City	Tel-Aviv
Period	6/09/04 → 7/09/04

ASJC Scopus subject areas

Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials

Cite this

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title = "Advanced methods for sub-pixel anomaly detection",

abstract = "A new sub-pixel target detection algorithm is developed, integrating the powerful {"}RX{"} anomaly detector of Reed and Yu (1990), with segmentation and post-processing filters. The integrated method consistently outperforms spectral anomaly detectors based on RX alone. A novel approach is presented to deal with false alarms caused by edges.",

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year = "2004",

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note = "2004 23rd IEEE Convention of Electrical and Electronics Engineers in Israel, Proceedings ; Conference date: 06-09-2004 Through 07-09-2004",

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AU - Rotman, S. R.

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AB - A new sub-pixel target detection algorithm is developed, integrating the powerful "RX" anomaly detector of Reed and Yu (1990), with segmentation and post-processing filters. The integrated method consistently outperforms spectral anomaly detectors based on RX alone. A novel approach is presented to deal with false alarms caused by edges.

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M3 - Paper

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T2 - 2004 23rd IEEE Convention of Electrical and Electronics Engineers in Israel, Proceedings

Y2 - 6 September 2004 through 7 September 2004

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Advanced methods for sub-pixel anomaly detection

Abstract

Conference

ASJC Scopus subject areas

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