Amplitudes of random telegraph noise in HTSC thin films

M. Bonaldi, G. Jung, A. Vecchione, S. Vitale

Research output: Contribution to journalArticlepeer-review

7 Scopus citations


Amplitudes of Random Telegraph Voltage Noise in YBaCuO and BiSrCaCuO thin films of different microstructures have been investigated. Telegraph voltage noise originates from thermally activated flux jumps converted into voltage signals by means of intrinsic Josephson junction cluster acting as a dc SQUID. Magnetic field dependencies of noise amplitudes are consistent with the proposed model.

Original languageEnglish
Pages (from-to)2037-2038
Number of pages2
JournalPhysica B: Condensed Matter
Issue numberPART 2
StatePublished - 2 Feb 1994
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering


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