Amplitudes of random telegraph noise in HTSC thin films

M. Bonaldi; G. Jung; A. Vecchione; S. Vitale

doi:10.1016/0921-4526(94)91518-0

Amplitudes of random telegraph noise in HTSC thin films

M. Bonaldi, G. Jung, A. Vecchione, S. Vitale

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

Abstract

Amplitudes of Random Telegraph Voltage Noise in YBaCuO and BiSrCaCuO thin films of different microstructures have been investigated. Telegraph voltage noise originates from thermally activated flux jumps converted into voltage signals by means of intrinsic Josephson junction cluster acting as a dc SQUID. Magnetic field dependencies of noise amplitudes are consistent with the proposed model.

Original language	English
Pages (from-to)	2037-2038
Number of pages	2
Journal	Physica B: Condensed Matter
Volume	194-196
Issue number	PART 2
DOIs	https://doi.org/10.1016/0921-4526(94)91518-0
State	Published - 2 Feb 1994
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering

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10.1016/0921-4526(94)91518-0

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@article{4c872589e3f34a08bb131550c36d027e,

title = "Amplitudes of random telegraph noise in HTSC thin films",

abstract = "Amplitudes of Random Telegraph Voltage Noise in YBaCuO and BiSrCaCuO thin films of different microstructures have been investigated. Telegraph voltage noise originates from thermally activated flux jumps converted into voltage signals by means of intrinsic Josephson junction cluster acting as a dc SQUID. Magnetic field dependencies of noise amplitudes are consistent with the proposed model.",

author = "M. Bonaldi and G. Jung and A. Vecchione and S. Vitale",

year = "1994",

month = feb,

day = "2",

doi = "10.1016/0921-4526(94)91518-0",

language = "English",

volume = "194-196",

pages = "2037--2038",

journal = "Physica B: Condensed Matter",

issn = "0921-4526",

publisher = "Elsevier",

number = "PART 2",

}

TY - JOUR

T1 - Amplitudes of random telegraph noise in HTSC thin films

AU - Bonaldi, M.

AU - Jung, G.

AU - Vecchione, A.

AU - Vitale, S.

PY - 1994/2/2

Y1 - 1994/2/2

N2 - Amplitudes of Random Telegraph Voltage Noise in YBaCuO and BiSrCaCuO thin films of different microstructures have been investigated. Telegraph voltage noise originates from thermally activated flux jumps converted into voltage signals by means of intrinsic Josephson junction cluster acting as a dc SQUID. Magnetic field dependencies of noise amplitudes are consistent with the proposed model.

AB - Amplitudes of Random Telegraph Voltage Noise in YBaCuO and BiSrCaCuO thin films of different microstructures have been investigated. Telegraph voltage noise originates from thermally activated flux jumps converted into voltage signals by means of intrinsic Josephson junction cluster acting as a dc SQUID. Magnetic field dependencies of noise amplitudes are consistent with the proposed model.

UR - http://www.scopus.com/inward/record.url?scp=0028759159&partnerID=8YFLogxK

U2 - 10.1016/0921-4526(94)91518-0

DO - 10.1016/0921-4526(94)91518-0

M3 - Article

AN - SCOPUS:0028759159

SN - 0921-4526

VL - 194-196

SP - 2037

EP - 2038

JO - Physica B: Condensed Matter

JF - Physica B: Condensed Matter

IS - PART 2

ER -

Amplitudes of random telegraph noise in HTSC thin films

Abstract

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