An AI Method for Early Detection of ailures Caused by Corrosion on Components During Assembly – Correlated to Field-Failure Analysis Cases

Research output: Contribution to journal › Article › peer-review

Original language	English
Journal	Printed Circuit Design and Fab/Circuits Assembly
Volume	40
Issue number	4
State	Published - 1 Apr 2023
Externally published	Yes

ASJC Scopus subject areas

@article{8bde83f9e4154e5b845f52acfc062d39,

title = "An AI Method for Early Detection of ailures Caused by Corrosion on Components During Assembly – Correlated to Field-Failure Analysis Cases",

author = "Eyal Weiss and Naveh Bartanah and Alon Shachar and Michael Dolkin",

year = "2023",

month = apr,

day = "1",

language = "English",

volume = "40",

journal = "Printed Circuit Design and Fab/Circuits Assembly",

issn = "1939-5442",

publisher = "U P Media Group Inc.",

number = "4",

}

TY - JOUR

T1 - An AI Method for Early Detection of ailures Caused by Corrosion on Components During Assembly – Correlated to Field-Failure Analysis Cases

AU - Weiss, Eyal

AU - Bartanah, Naveh

AU - Shachar, Alon

AU - Dolkin, Michael

PY - 2023/4/1

Y1 - 2023/4/1

UR - https://www.scopus.com/pages/publications/85202649447

M3 - Article

AN - SCOPUS:85202649447

SN - 1939-5442

VL - 40

JO - Printed Circuit Design and Fab/Circuits Assembly

JF - Printed Circuit Design and Fab/Circuits Assembly

IS - 4

ER -