An analytical model for rolling-element-spall interaction in bearing inner race

Eyal Madar, Gideon Kogan, Jacob Bortman, Renata Klein

Research output: Contribution to conferencePaperpeer-review

2 Scopus citations

Abstract

Assessment of the remaining useful life of a rolling-element bearing is an important subject in rotating machines prognostics. Evaluation of the bearing remaining useful life requires not only diagnosis of the fault existence but also an estimate of its severity. For bearings, a common failure mechanism is spalling in the raceways. In this study an analytical model of the interaction between a rolling-element and a spalled inner race is presented. An explicit expression of the spall size as function of the time interval between the effects of the rolling-element entrance and exit from the spall has been developed by considering the system operating condition and the bearing characteristics. Additionally, expression for minimum spall size and spall depth were developed. The results of the analytical model were implemented in an algorithm for estimation of the spall size in bearing inner race based on vibration signatures. Hence, the algorithm is based on the dynamics of the tested bearing. Furthermore, the presented algorithm operates automatically given the system operation condition and the bearing characteristics. Experimental results of various spall sizes in the bearing inner race were used to validate this algorithm. This study broadens recent studies on estimation of spall size located in bearing inner race while the inner ring rotates and the outer ring is fixed.

Original languageEnglish
StatePublished - 1 Jan 2017
Event1st World Congress on Condition Monitoring 2017, WCCM 2017 - London, United Kingdom
Duration: 13 Jun 201716 Jun 2017

Conference

Conference1st World Congress on Condition Monitoring 2017, WCCM 2017
Country/TerritoryUnited Kingdom
CityLondon
Period13/06/1716/06/17

ASJC Scopus subject areas

  • Energy Engineering and Power Technology
  • Safety, Risk, Reliability and Quality
  • Electrical and Electronic Engineering

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