Abstract
EPR active species were found in irradiated C60 thin films at room temperature both as-grown and after irradiation by light. The samples exhibit a singlet Lorentzian line with g = 2.0026 ± 0.0002 and ΔHPP = 0.124 ± 0.005 mT which may be attributed to holes localized at rapidly rotating C60 molecules, i.e. C60+ free radicals. The bulk density of the C60+ radicals in the as-grown samples depends on the conditions of the sample preparation and reaches 1 spin per 10 000 molecules for fast-grown films. Annealing at 570 K leads to a rapid decrease in that density. Irradiation of the C60 thin films by visible and UV light leads to a significant increase in the number of the same C60+ radicals. The total number of photoinduced defects depends on the light intensity and time of exposure. The irradiation by visible light is active only in the presence of oxygen whereas the UV irradiation acts also when the sample is kept in an inert atmosphere. At ambient conditions the C60+ radicals are metastable with life time of several months.
Original language | English |
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Pages (from-to) | 134-139 |
Number of pages | 6 |
Journal | Materials Science and Engineering B |
Volume | 45 |
Issue number | 1-3 |
DOIs | |
State | Published - 1 Jan 1997 |
Keywords
- As-grown defects
- C
- EPR
- Photoinduced defects
- Thin film
ASJC Scopus subject areas
- General Materials Science
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering