TY - GEN
T1 - An improved AB2C scheme for leakage power reduction in image sensors with on-chip memory
AU - Teman, Adam
AU - Yadid-Pecht, Orly
AU - Fish, Alexander
PY - 2009/12/1
Y1 - 2009/12/1
N2 - Static leakage power is the major component of power consumption in large arrays that operate at a low activity factor. "Smart" image sensors with advanced in-pixel functionality frequently include large on-chip memory arrays for storage of per-pixel data. These systems periodically transfer data from pixels to their corresponding memory bits in a serial access scheme with a relatively low activity factor. Recently, an Adaptive Bulk Biasing Control (AB2C) Scheme for leakage reduction in image sensors was presented. In this paper, we introduce an improved AB2C scheme that expands the functionality for on-chip memory leakage reduction, in addition to that of the image sensor. In the proposed system, a symmetric voltage distribution is applied around the active row, providing reverse body biasing on deactivated rows to reduce leakage. A test case circuit was implemented in a standard 90nm TSMC process is presented, showing a static power reduction of 26%.
AB - Static leakage power is the major component of power consumption in large arrays that operate at a low activity factor. "Smart" image sensors with advanced in-pixel functionality frequently include large on-chip memory arrays for storage of per-pixel data. These systems periodically transfer data from pixels to their corresponding memory bits in a serial access scheme with a relatively low activity factor. Recently, an Adaptive Bulk Biasing Control (AB2C) Scheme for leakage reduction in image sensors was presented. In this paper, we introduce an improved AB2C scheme that expands the functionality for on-chip memory leakage reduction, in addition to that of the image sensor. In the proposed system, a symmetric voltage distribution is applied around the active row, providing reverse body biasing on deactivated rows to reduce leakage. A test case circuit was implemented in a standard 90nm TSMC process is presented, showing a static power reduction of 26%.
UR - http://www.scopus.com/inward/record.url?scp=77951142239&partnerID=8YFLogxK
U2 - 10.1109/ICSENS.2009.5398197
DO - 10.1109/ICSENS.2009.5398197
M3 - Conference contribution
AN - SCOPUS:77951142239
SN - 9781424445486
T3 - Proceedings of IEEE Sensors
SP - 193
EP - 196
BT - IEEE Sensors 2009 Conference - SENSORS 2009
T2 - IEEE Sensors 2009 Conference - SENSORS 2009
Y2 - 25 October 2009 through 28 October 2009
ER -