An Instrument for Continuously Measuring Capacitance Changes

Ben Zion Kaplan, Ysiah Sagy, David M. Jacobson

Research output: Contribution to journalArticlepeer-review

5 Scopus citations


A method of measurement which can be applied to resolve small capacitance changes and yet can respond linearly to large capacitance changes was described by us previously. In the present paper this method is discussed further, and it is shown how it can be used to develop a versatile instrument which finds important applications in variety of physical measurements. The general features of the instrument are considered with suggestions of further improvement.

Original languageEnglish
Pages (from-to)43-45
Number of pages3
JournalIEEE Transactions on Instrumentation and Measurement
Issue number1
StatePublished - 1 Jan 1978

ASJC Scopus subject areas

  • Instrumentation
  • Electrical and Electronic Engineering


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