A method of measurement which can be applied to resolve small capacitance changes and yet can respond linearly to large capacitance changes was described by us previously. In the present paper this method is discussed further, and it is shown how it can be used to develop a versatile instrument which finds important applications in variety of physical measurements. The general features of the instrument are considered with suggestions of further improvement.
|Number of pages||3|
|Journal||IEEE Transactions on Instrumentation and Measurement|
|State||Published - 1 Jan 1978|
ASJC Scopus subject areas
- Electrical and Electronic Engineering