An Instrument for Continuously Measuring Capacitance Changes

Ben Zion Kaplan; Ysiah Sagy; David M. Jacobson

doi:10.1109/TIM.1978.4314615

An Instrument for Continuously Measuring Capacitance Changes

Ben Zion Kaplan, Ysiah Sagy, David M. Jacobson

Department of Electrical & Computer Engineering

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Abstract

A method of measurement which can be applied to resolve small capacitance changes and yet can respond linearly to large capacitance changes was described by us previously. In the present paper this method is discussed further, and it is shown how it can be used to develop a versatile instrument which finds important applications in variety of physical measurements. The general features of the instrument are considered with suggestions of further improvement.

Original language	English
Pages (from-to)	43-45
Number of pages	3
Journal	IEEE Transactions on Instrumentation and Measurement
Volume	27
Issue number	1
DOIs	https://doi.org/10.1109/TIM.1978.4314615
State	Published - 1 Jan 1978

ASJC Scopus subject areas

Instrumentation
Electrical and Electronic Engineering

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10.1109/TIM.1978.4314615

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@article{b1dea05753f54f7f9ee1759a1e3aab13,

title = "An Instrument for Continuously Measuring Capacitance Changes",

abstract = "A method of measurement which can be applied to resolve small capacitance changes and yet can respond linearly to large capacitance changes was described by us previously. In the present paper this method is discussed further, and it is shown how it can be used to develop a versatile instrument which finds important applications in variety of physical measurements. The general features of the instrument are considered with suggestions of further improvement.",

author = "Kaplan, {Ben Zion} and Ysiah Sagy and Jacobson, {David M.}",

year = "1978",

month = jan,

day = "1",

doi = "10.1109/TIM.1978.4314615",

language = "English",

volume = "27",

pages = "43--45",

journal = "IEEE Transactions on Instrumentation and Measurement",

issn = "0018-9456",

publisher = "Institute of Electrical and Electronics Engineers",

number = "1",

}

TY - JOUR

T1 - An Instrument for Continuously Measuring Capacitance Changes

AU - Kaplan, Ben Zion

AU - Sagy, Ysiah

AU - Jacobson, David M.

PY - 1978/1/1

Y1 - 1978/1/1

N2 - A method of measurement which can be applied to resolve small capacitance changes and yet can respond linearly to large capacitance changes was described by us previously. In the present paper this method is discussed further, and it is shown how it can be used to develop a versatile instrument which finds important applications in variety of physical measurements. The general features of the instrument are considered with suggestions of further improvement.

AB - A method of measurement which can be applied to resolve small capacitance changes and yet can respond linearly to large capacitance changes was described by us previously. In the present paper this method is discussed further, and it is shown how it can be used to develop a versatile instrument which finds important applications in variety of physical measurements. The general features of the instrument are considered with suggestions of further improvement.

UR - http://www.scopus.com/inward/record.url?scp=0017943981&partnerID=8YFLogxK

U2 - 10.1109/TIM.1978.4314615

DO - 10.1109/TIM.1978.4314615

M3 - Article

AN - SCOPUS:0017943981

SN - 0018-9456

VL - 27

SP - 43

EP - 45

JO - IEEE Transactions on Instrumentation and Measurement

JF - IEEE Transactions on Instrumentation and Measurement

IS - 1

ER -

An Instrument for Continuously Measuring Capacitance Changes

Abstract

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