An x-ray diffraction study of implantation damage in insb reduced by a magnetic field

First results of an x-ray diffraction study of a newly found substantial reduction in radiation damage by permanent magnetic fields in InSb single crystafs during implantation with ln+ ions are discussed. The data indicate that, in the presence of a permanent magnetic field, there is a decrease in formation of point defects, and in their trend to form clusters. These observations are supported by Rutherford backscattering measurements. A scheme to perform grazing-incidence measurements using a diffractometer equipped with parallel beam optics is presented.