An x-ray photoelectron-spectroscopy study of Naβ-alumina surfaces

A. Livshits, M. Polak

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

The cleavage-face of a sodim-β-alumina crystal was studied by means of X-ray photoelectron spectroscopy (XPS). A detailed quantitative analysis, which took into account the particular layered structure in this crystal, revealed a significantly (≈50%) Na deficient surface produced by cleaving the crystal along a conduction plane. The expressions derived for the elemental composition are applicable to any layered structure. Ion sputtering of the cleavage surface caused atom mixing in the layered structure as well as a preferential removal of the mobile sodium ions. Auger electron spectroscopy (AES) measurements showed that unlike the cleavage surface, the edge surface contains a significantly high concentration of sodium.

Original languageEnglish
Pages (from-to)311-318
Number of pages8
JournalSolid State Ionics
Volume6
Issue number4
DOIs
StatePublished - 1 Jan 1982

ASJC Scopus subject areas

  • Chemistry (all)
  • Materials Science (all)
  • Condensed Matter Physics

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