Abstract
The cleavage-face of a sodim-β-alumina crystal was studied by means of X-ray photoelectron spectroscopy (XPS). A detailed quantitative analysis, which took into account the particular layered structure in this crystal, revealed a significantly (≈50%) Na deficient surface produced by cleaving the crystal along a conduction plane. The expressions derived for the elemental composition are applicable to any layered structure. Ion sputtering of the cleavage surface caused atom mixing in the layered structure as well as a preferential removal of the mobile sodium ions. Auger electron spectroscopy (AES) measurements showed that unlike the cleavage surface, the edge surface contains a significantly high concentration of sodium.
Original language | English |
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Pages (from-to) | 311-318 |
Number of pages | 8 |
Journal | Solid State Ionics |
Volume | 6 |
Issue number | 4 |
DOIs | |
State | Published - 1 Jan 1982 |
ASJC Scopus subject areas
- General Chemistry
- General Materials Science
- Condensed Matter Physics