Analytical model of electrodiffusion of metals in fullerene thin films

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This paper presents a theoretical model of doping of C60 thin films by the diffusion of ions from metal electrodes under the action of external electric bias. In the case of Au diffusion, the final nonlinear parabolic partial differential equation for the concentration of mobile metal ions was solved numerically by the finite difference method for a given electric current (galvanostatic operation). This yields the time evolution of ionic concentration profiles for different currents. A significant increase in the rate of Au ion penetration into C60 films with increasing electric current is predicted by these calculations in agreement with the published experimental observations.

Original languageEnglish
Pages (from-to)2803-2805
Number of pages3
JournalJapanese Journal of Applied Physics
Issue number4 B
StatePublished - 1 Apr 2005


  • Diffusion
  • Explicit finite difference method
  • Fullerenes
  • Thin films

ASJC Scopus subject areas

  • General Engineering
  • General Physics and Astronomy


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