Anti-phase domain boundaries in ZnGeP2 (ZGP)

Y. Shimony; R. Fledman; I. Dahan; G. Kimmel

doi:10.1016/S0925-3467(00)00067-7

Anti-phase domain boundaries in ZnGeP₂ (ZGP)

Y. Shimony, R. Fledman, I. Dahan, G. Kimmel

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

Coherently oriented cubic defects were recently reported to exist within the tetragonal lattice of zinc-germanium-phosphide, ZnGeP₂ (ZGP). X-ray diffraction utilizing whole pattern optimization (Rietveld method) and line-profile-fitting (LPF) enabled us to identify these defects. In the present research, transmission electron microscopy (TEM) was used for direct observation of these defects. The bright field and dark field TEM images of the ZGP foil indicate the existence of anti-phase domain boundaries (APB). Electron diffraction patterns clearly reveal two coherently oriented entities, one of a tetragonal symmetry in accordance with the chalcopyrite lattice, the other however of a cubic symmetry. This confirms our former finding of the existence of coherently oriented cubic defects in as-grown chalcopyrite ZGP crystal.

Original language	English
Pages (from-to)	119-123
Number of pages	5
Journal	Optical Materials
Volume	16
Issue number	1-2
DOIs	https://doi.org/10.1016/S0925-3467(00)00067-7
State	Published - 1 Jan 2001
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
General Computer Science
Atomic and Molecular Physics, and Optics
Spectroscopy
Physical and Theoretical Chemistry
Organic Chemistry
Inorganic Chemistry
Electrical and Electronic Engineering

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title = "Anti-phase domain boundaries in ZnGeP2 (ZGP)",

abstract = "Coherently oriented cubic defects were recently reported to exist within the tetragonal lattice of zinc-germanium-phosphide, ZnGeP2 (ZGP). X-ray diffraction utilizing whole pattern optimization (Rietveld method) and line-profile-fitting (LPF) enabled us to identify these defects. In the present research, transmission electron microscopy (TEM) was used for direct observation of these defects. The bright field and dark field TEM images of the ZGP foil indicate the existence of anti-phase domain boundaries (APB). Electron diffraction patterns clearly reveal two coherently oriented entities, one of a tetragonal symmetry in accordance with the chalcopyrite lattice, the other however of a cubic symmetry. This confirms our former finding of the existence of coherently oriented cubic defects in as-grown chalcopyrite ZGP crystal.",

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T1 - Anti-phase domain boundaries in ZnGeP2 (ZGP)

AU - Shimony, Y.

AU - Fledman, R.

AU - Dahan, I.

AU - Kimmel, G.

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Y1 - 2001/1/1

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AB - Coherently oriented cubic defects were recently reported to exist within the tetragonal lattice of zinc-germanium-phosphide, ZnGeP2 (ZGP). X-ray diffraction utilizing whole pattern optimization (Rietveld method) and line-profile-fitting (LPF) enabled us to identify these defects. In the present research, transmission electron microscopy (TEM) was used for direct observation of these defects. The bright field and dark field TEM images of the ZGP foil indicate the existence of anti-phase domain boundaries (APB). Electron diffraction patterns clearly reveal two coherently oriented entities, one of a tetragonal symmetry in accordance with the chalcopyrite lattice, the other however of a cubic symmetry. This confirms our former finding of the existence of coherently oriented cubic defects in as-grown chalcopyrite ZGP crystal.

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Anti-phase domain boundaries in ZnGeP₂ (ZGP)

Abstract

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