Asymptotic analysis of marginal-likelihood based estimators for m-dependent processes

Yair Noam, Joseph Tabrikian

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

This paper derives and analyzes the asymptotic performances of the maximum-likelihood (ML) estimator derived under the assumption of independent identically distribution (i.i.d.) samples, where in the actual model the signal samples are m-dependent. The ML under such a modeling mismatch is based on the marginal likelihood function, and is referred to as marginal maximum likelihood (MML). Under some regularity conditions, the asymptotical distribution of the MML is derived. The asymptotical distributions in some signal processing examples are analyzed. Simulation results support the theory via an example.

Original languageEnglish
Title of host publication2006 IEEE 24th Convention of Electrical and Electronics Engineers in Israel, IEEEI
Pages275-279
Number of pages5
DOIs
StatePublished - 1 Dec 2006
Event2006 IEEE 24th Convention of Electrical and Electronics Engineers in Israel, IEEEI - Eilat, Israel
Duration: 15 Nov 200617 Nov 2006

Publication series

NameIEEE Convention of Electrical and Electronics Engineers in Israel, Proceedings

Conference

Conference2006 IEEE 24th Convention of Electrical and Electronics Engineers in Israel, IEEEI
Country/TerritoryIsrael
CityEilat
Period15/11/0617/11/06

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Fingerprint

Dive into the research topics of 'Asymptotic analysis of marginal-likelihood based estimators for m-dependent processes'. Together they form a unique fingerprint.

Cite this