Atomic force microscopy with time resolution of microseconds

M. Anwar; I. Rousso

doi:10.1063/1.1843277

Atomic force microscopy with time resolution of microseconds

M. Anwar, I. Rousso

Research output: Contribution to journal › Article › peer-review

11 Scopus citations

Abstract

The atomic force microscope (AFM) can acquire high-resolution images under nondestructive conditions albeit at a very poor temporal resolution. This work presents two AFM mapping techniques, stroboscopic, and continuous, for imaging rapid periodical processes with nanometer spatial resolution and microsecond time resolution. Application of these methods is demonstrated for imaging very rapid cyclic changes in the position of a microfabricated grid. Motion was resolved with 10 nm spatial resolution, and 5 and 25 μs temporal resolution using the stroboscopic and continuous mode, respectively. The proposed methods have the potential to image wide variety of rapid processes with unparalleled combination of lateral and temporal resolutions.

Original language	English
Article number	014101
Pages (from-to)	014101-1-014101-3
Journal	Applied Physics Letters
Volume	86
Issue number	1
DOIs	https://doi.org/10.1063/1.1843277
State	Published - 1 Jan 2005
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.1843277

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abstract = "The atomic force microscope (AFM) can acquire high-resolution images under nondestructive conditions albeit at a very poor temporal resolution. This work presents two AFM mapping techniques, stroboscopic, and continuous, for imaging rapid periodical processes with nanometer spatial resolution and microsecond time resolution. Application of these methods is demonstrated for imaging very rapid cyclic changes in the position of a microfabricated grid. Motion was resolved with 10 nm spatial resolution, and 5 and 25 μs temporal resolution using the stroboscopic and continuous mode, respectively. The proposed methods have the potential to image wide variety of rapid processes with unparalleled combination of lateral and temporal resolutions.",

author = "M. Anwar and I. Rousso",

note = "Funding Information: The authors would like to thank Professor D. Freeman and Professor P. Matsudaira for useful suggestions and discussion. M.A. is supported by the NSDEG Fellowship sponsored by the Department of Defense and by the Whitaker Foundation Graduate Fellowship. This work made use of MRSEC Shared Facilities supported by the National Science Foundation under Award No. DMR-0213282.",

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N2 - The atomic force microscope (AFM) can acquire high-resolution images under nondestructive conditions albeit at a very poor temporal resolution. This work presents two AFM mapping techniques, stroboscopic, and continuous, for imaging rapid periodical processes with nanometer spatial resolution and microsecond time resolution. Application of these methods is demonstrated for imaging very rapid cyclic changes in the position of a microfabricated grid. Motion was resolved with 10 nm spatial resolution, and 5 and 25 μs temporal resolution using the stroboscopic and continuous mode, respectively. The proposed methods have the potential to image wide variety of rapid processes with unparalleled combination of lateral and temporal resolutions.

AB - The atomic force microscope (AFM) can acquire high-resolution images under nondestructive conditions albeit at a very poor temporal resolution. This work presents two AFM mapping techniques, stroboscopic, and continuous, for imaging rapid periodical processes with nanometer spatial resolution and microsecond time resolution. Application of these methods is demonstrated for imaging very rapid cyclic changes in the position of a microfabricated grid. Motion was resolved with 10 nm spatial resolution, and 5 and 25 μs temporal resolution using the stroboscopic and continuous mode, respectively. The proposed methods have the potential to image wide variety of rapid processes with unparalleled combination of lateral and temporal resolutions.

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Atomic force microscopy with time resolution of microseconds

Abstract

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