Bulk changes in semiconductors using scanning probe microscopy: nm-size fabricated structures

Shachar Richter, Yishay Manassen, David Cahen

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Fingerprint

Dive into the research topics of 'Bulk changes in semiconductors using scanning probe microscopy: nm-size fabricated structures'. Together they form a unique fingerprint.

Keyphrases

Engineering

Material Science