TY - GEN
T1 - Carbon nanotube self-assembeled high frequency resonator
AU - Ya'akobovitz, Assaf
AU - Karp, Gabriel
AU - David-Pur, Moshe
AU - Krylov, S.
AU - Hanein, Yael
PY - 2010/6/1
Y1 - 2010/6/1
N2 - We present a single wall carbon nanotube (SWCNT) based high frequency resonator fabricated using a novel process suitable for mass fabrication. The integration of the electrostatically actuated SWCNT into the silicon structure was achieved by a specially tailored fabrication process which is characterized by simplicity and compatibility with commonly used micro-machining processes. The fabrication process enables the control of the SWCNT positioning and its length and results in a taut and clean suspended SWCNT. Electro-mechanical testing of these devices demonstrates a resonance frequency of 13.4 MHz. Resonators with various resonance frequencies can be readily fabricated by varying the SWCNT length.
AB - We present a single wall carbon nanotube (SWCNT) based high frequency resonator fabricated using a novel process suitable for mass fabrication. The integration of the electrostatically actuated SWCNT into the silicon structure was achieved by a specially tailored fabrication process which is characterized by simplicity and compatibility with commonly used micro-machining processes. The fabrication process enables the control of the SWCNT positioning and its length and results in a taut and clean suspended SWCNT. Electro-mechanical testing of these devices demonstrates a resonance frequency of 13.4 MHz. Resonators with various resonance frequencies can be readily fabricated by varying the SWCNT length.
UR - http://www.scopus.com/inward/record.url?scp=77952774637&partnerID=8YFLogxK
U2 - 10.1109/MEMSYS.2010.5442472
DO - 10.1109/MEMSYS.2010.5442472
M3 - Conference contribution
AN - SCOPUS:77952774637
SN - 9781424457649
T3 - Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)
SP - 432
EP - 435
BT - MEMS 2010 - The 23rd IEEE International Conference on Micro Electro Mechanical Systems, Technical Digest
T2 - 23rd IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2010
Y2 - 24 January 2010 through 28 January 2010
ER -