Abstract
The excitation dependent carrier recombination lifetime in periodically 5-doped strained InGaAs/GaAs multiple quantum well structures has been investigated both experimentally and theoretically. Experimentally, we find more than six orders of magnitude increase in the lifetime over that for undoped material due to the spatial separation of photogenerated carriers. This results in strong photo-optic effects and optical nonlinearities. Calculations, on the other hand, predict intrinsic recombination lifetimes in the periodically 5-doped material far above those found experimentally. Using secondary ion mass spectroscopy, transmission electron microscopy, cathodoluminescence imaging, and electron beam induced absorption modulation imaging we find evidence for misfit dislocation related recombination mechanisms that limit the carrier lifetime in the strained quantum well material.
Original language | English |
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Pages (from-to) | 478-489 |
Number of pages | 12 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 1985 |
DOIs | |
State | Published - 1 Jan 1993 |
Externally published | Yes |
Event | Physical Concepts and Materials for Novel Optoelectronic Device Applications II 1993 - Trieste, Italy Duration: 23 May 1993 → 28 May 1993 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering