TY - GEN
T1 - Clustering di-graphs for continuously verifying users according to their typing patterns
AU - Shimshon, Tomer
AU - Moskovitch, Robert
AU - Rokach, Lior
AU - Elovici, Yuval
PY - 2010/12/1
Y1 - 2010/12/1
N2 - Traditionally users are authenticated based on a username and password. However, a logged station is still vulnerable to imposters when the user leaves her computer without logging off. Keystroke dynamics methods can be useful to continuously verify a user, after the authentication process has successfully ended. Within the last decade several studies proposed the use of keystroke dynamics as a behavioral biometric tool to verify users. We propose a new method, for compactly representing the keystroke patterns by joining similar pairs of consecutive keystrokes. The proposed method considers clustering di-graphs based on their temporal features. The proposed method was evaluated on 10 legitimate users and 15 imposters. Encouraging results suggest that the proposed method detection performance is better than that of existing methods. Specifically we reach a False Acceptance Rate (FAR) of 0.41% and a False Rejection Rate (FRR) of 0.63%.
AB - Traditionally users are authenticated based on a username and password. However, a logged station is still vulnerable to imposters when the user leaves her computer without logging off. Keystroke dynamics methods can be useful to continuously verify a user, after the authentication process has successfully ended. Within the last decade several studies proposed the use of keystroke dynamics as a behavioral biometric tool to verify users. We propose a new method, for compactly representing the keystroke patterns by joining similar pairs of consecutive keystrokes. The proposed method considers clustering di-graphs based on their temporal features. The proposed method was evaluated on 10 legitimate users and 15 imposters. Encouraging results suggest that the proposed method detection performance is better than that of existing methods. Specifically we reach a False Acceptance Rate (FAR) of 0.41% and a False Rejection Rate (FRR) of 0.63%.
UR - http://www.scopus.com/inward/record.url?scp=78651227548&partnerID=8YFLogxK
U2 - 10.1109/EEEI.2010.5662182
DO - 10.1109/EEEI.2010.5662182
M3 - Conference contribution
AN - SCOPUS:78651227548
SN - 9781424486809
T3 - 2010 IEEE 26th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2010
SP - 445
EP - 449
BT - 2010 IEEE 26th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2010
T2 - 2010 IEEE 26th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2010
Y2 - 17 November 2010 through 20 November 2010
ER -