CMOS APS crosstalk characterization via a unique submicron scanning system

Igor Shcherback, Orly Yadid-Pecht

Research output: Contribution to journalArticlepeer-review

20 Scopus citations


This brief introduces a novel way for CMOS APS crosstalk (CTK) determination and prediction based on our unique SSS measurements. It enables the crosstalk magnitude determination, the tracking of its main causes, and can be used as a predictive tool for design optimization. A pronounced crosstalk asymmetry within the array which was revealed by the measurements is analyzed and modeled. The result points out that CMOS APS crosstalk is mostly affected by the specific pixel architecture and the pixels arrangement within the array.

Original languageEnglish
Pages (from-to)1994-1997
Number of pages4
JournalIEEE Transactions on Electron Devices
Issue number9
StatePublished - 1 Sep 2003


  • CMOS active pixel sensor (APS)
  • Crosstalk (CTK)
  • Diffusion process
  • Modeling
  • Point spread function (PSF)

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering


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