CMOS APS crosstalk characterization via a unique submicron scanning system

Igor Shcherback; Orly Yadid-Pecht

doi:10.1109/TED.2003.815594

CMOS APS crosstalk characterization via a unique submicron scanning system

Igor Shcherback, Orly Yadid-Pecht

Department of Electrical & Computer Engineering

Research output: Contribution to journal › Article › peer-review

20 Scopus citations

Abstract

This brief introduces a novel way for CMOS APS crosstalk (CTK) determination and prediction based on our unique SSS measurements. It enables the crosstalk magnitude determination, the tracking of its main causes, and can be used as a predictive tool for design optimization. A pronounced crosstalk asymmetry within the array which was revealed by the measurements is analyzed and modeled. The result points out that CMOS APS crosstalk is mostly affected by the specific pixel architecture and the pixels arrangement within the array.

Original language	English
Pages (from-to)	1994-1997
Number of pages	4
Journal	IEEE Transactions on Electron Devices
Volume	50
Issue number	9
DOIs	https://doi.org/10.1109/TED.2003.815594
State	Published - 1 Sep 2003

Keywords

CMOS active pixel sensor (APS)
Crosstalk (CTK)
Diffusion process
Modeling
Point spread function (PSF)

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

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10.1109/TED.2003.815594

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abstract = "This brief introduces a novel way for CMOS APS crosstalk (CTK) determination and prediction based on our unique SSS measurements. It enables the crosstalk magnitude determination, the tracking of its main causes, and can be used as a predictive tool for design optimization. A pronounced crosstalk asymmetry within the array which was revealed by the measurements is analyzed and modeled. The result points out that CMOS APS crosstalk is mostly affected by the specific pixel architecture and the pixels arrangement within the array.",

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AB - This brief introduces a novel way for CMOS APS crosstalk (CTK) determination and prediction based on our unique SSS measurements. It enables the crosstalk magnitude determination, the tracking of its main causes, and can be used as a predictive tool for design optimization. A pronounced crosstalk asymmetry within the array which was revealed by the measurements is analyzed and modeled. The result points out that CMOS APS crosstalk is mostly affected by the specific pixel architecture and the pixels arrangement within the array.

KW - CMOS active pixel sensor (APS)

KW - Crosstalk (CTK)

KW - Diffusion process

KW - Modeling

KW - Point spread function (PSF)

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CMOS APS crosstalk characterization via a unique submicron scanning system

Abstract

Keywords

ASJC Scopus subject areas

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