CMOS image sensor employing 3.3 V 12 bit 6.3 MS/s pipelined ADC

Shy Hamami, Leonid Fleshel, Orly Yadid-Pecht

    Research output: Contribution to journalArticlepeer-review

    10 Scopus citations

    Abstract

    This paper presents an implementation of a conventional 256 × 256 CMOS image sensor (CIS) system with on-chip 12 bit, 6.3 MS/s CMOS pipelined analog-to-digital converter (ADC). The test chip has been implemented in 0.35 μm 2P4M process, operated by a 3.3 V supply and its total power consumption is only 50 mW with maximum DNL of -0.8 LSB and maximum INL of ±4.2 LSB under 6.3 MS/s. The total area of the prototype is 12 mm2, and the core area of ADC is only 18% of the total area. System architecture and operation are discussed and measurements from a test chip are showed.

    Original languageEnglish
    Pages (from-to)119-125
    Number of pages7
    JournalSensors and Actuators, A: Physical
    Volume135
    Issue number1
    DOIs
    StatePublished - 30 Mar 2007

    Keywords

    • Active pixel sensor
    • Analog-to-digital conversion
    • CMOS imagers
    • Pipelined ADC

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Instrumentation
    • Condensed Matter Physics
    • Surfaces, Coatings and Films
    • Metals and Alloys
    • Electrical and Electronic Engineering

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