Abstract
The coherence length ξc along c-axis direction in (1 0 3)/(0 1 3) oriented YBCO superconductor thin films has been evaluated from the temperature dependence of current-voltage (I-V) characteristics of micro-bridges in the framework of a model taking in account thermally activated magnetic flux creep in the intrinsic potential of the layered structure of the superconductor. The coherence length gradually increased from the initial value ξc = 0.14 nm to ξc = 0.33 nm in the sample subjected to subsequent annealing steps performed in air at increasing temperatures from a range Ta = 190-275 °C. Structural modifications of deoxygenated samples were monitored by micro-Raman spectroscopy. The critical temperature Tc slightly increases after the initial annealing steps while a significant Tc decrease has been observed after Ta = 275 °C stage accompanied by appearance of the tetragonal phase in the crystal structure.
Original language | English |
---|---|
Pages (from-to) | 805-806 |
Number of pages | 2 |
Journal | Physica C: Superconductivity and its Applications |
Volume | 460-462 II |
Issue number | SPEC. ISS. |
DOIs | |
State | Published - 1 Sep 2007 |
Keywords
- Coherence length
- Micro-Raman spectroscopy
- YBCO films
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Energy Engineering and Power Technology
- Electrical and Electronic Engineering