Collection of test case sequences: Covering of function cluster digraph

Mark Sh Levin, Mark Last

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

The paper focuses on multi-function system testing in the case of multi-stage testing process. In this paper we deal with the problem of covering a digraph of system function clusters by chains (trails) of test cases. The problem is solved by the combinatorial algorithms which include special case algorithms (e.g., tree-like digraph); approximation-based, partitioning-based, and greedy algorithms; and an algorithm based on the maximal matching. Numerical examples illustrate our approach.

Original languageEnglish
Title of host publicationProceedings of the IASTED International Conference on Artificial Intelligence and Applications (as part of the 22nd IASTED International Multi-Conference on Applied Informatics)
EditorsM.H. Hamza
Pages806-810
Number of pages5
StatePublished - 1 Dec 2004
EventProceedings of the IASTED International Conference on Artificial Intelligence and Applications (as part of the 22nd IASTED International Multi-Conference on Applied Informatics - Innsbruck, Austria
Duration: 16 Feb 200418 Feb 2004

Publication series

NameProceedings of the IASTED International Conference. Applied Informatics

Conference

ConferenceProceedings of the IASTED International Conference on Artificial Intelligence and Applications (as part of the 22nd IASTED International Multi-Conference on Applied Informatics
Country/TerritoryAustria
CityInnsbruck
Period16/02/0418/02/04

Keywords

  • Chain covering of digraph
  • Combinatorial algorithms
  • Combinatorial optimization
  • Functional testing
  • Input-output analysis
  • System testing
  • Test case sequence

ASJC Scopus subject areas

  • Engineering (all)

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