Collection of test case sequences: Covering of function cluster digraph

Mark Sh Levin; Mark Last

Collection of test case sequences: Covering of function cluster digraph

Mark Sh Levin, Mark Last

Department of Software and Information Systems Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

3 Scopus citations

Abstract

The paper focuses on multi-function system testing in the case of multi-stage testing process. In this paper we deal with the problem of covering a digraph of system function clusters by chains (trails) of test cases. The problem is solved by the combinatorial algorithms which include special case algorithms (e.g., tree-like digraph); approximation-based, partitioning-based, and greedy algorithms; and an algorithm based on the maximal matching. Numerical examples illustrate our approach.

Original language	English
Title of host publication	Proceedings of the IASTED International Conference on Artificial Intelligence and Applications (as part of the 22nd IASTED International Multi-Conference on Applied Informatics)
Editors	M.H. Hamza
Pages	806-810
Number of pages	5
State	Published - 1 Dec 2004
Event	Proceedings of the IASTED International Conference on Artificial Intelligence and Applications (as part of the 22nd IASTED International Multi-Conference on Applied Informatics - Innsbruck, Austria Duration: 16 Feb 2004 → 18 Feb 2004

Publication series

Name	Proceedings of the IASTED International Conference. Applied Informatics

Conference

Conference	Proceedings of the IASTED International Conference on Artificial Intelligence and Applications (as part of the 22nd IASTED International Multi-Conference on Applied Informatics
Country/Territory	Austria
City	Innsbruck
Period	16/02/04 → 18/02/04

Keywords

Chain covering of digraph
Combinatorial algorithms
Combinatorial optimization
Functional testing
Input-output analysis
System testing
Test case sequence

ASJC Scopus subject areas

General Engineering

Cite this

Levin, M. S., & Last, M. (2004). Collection of test case sequences: Covering of function cluster digraph. In M. H. Hamza (Ed.), Proceedings of the IASTED International Conference on Artificial Intelligence and Applications (as part of the 22nd IASTED International Multi-Conference on Applied Informatics) (pp. 806-810). Article 411-083 (Proceedings of the IASTED International Conference. Applied Informatics).

Levin, Mark Sh ; Last, Mark. / Collection of test case sequences : Covering of function cluster digraph. Proceedings of the IASTED International Conference on Artificial Intelligence and Applications (as part of the 22nd IASTED International Multi-Conference on Applied Informatics). editor / M.H. Hamza. 2004. pp. 806-810 (Proceedings of the IASTED International Conference. Applied Informatics).

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title = "Collection of test case sequences: Covering of function cluster digraph",

abstract = "The paper focuses on multi-function system testing in the case of multi-stage testing process. In this paper we deal with the problem of covering a digraph of system function clusters by chains (trails) of test cases. The problem is solved by the combinatorial algorithms which include special case algorithms (e.g., tree-like digraph); approximation-based, partitioning-based, and greedy algorithms; and an algorithm based on the maximal matching. Numerical examples illustrate our approach.",

keywords = "Chain covering of digraph, Combinatorial algorithms, Combinatorial optimization, Functional testing, Input-output analysis, System testing, Test case sequence",

author = "Levin, {Mark Sh} and Mark Last",

year = "2004",

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language = "English",

isbn = "088986375X",

series = "Proceedings of the IASTED International Conference. Applied Informatics",

pages = "806--810",

editor = "M.H. Hamza",

booktitle = "Proceedings of the IASTED International Conference on Artificial Intelligence and Applications (as part of the 22nd IASTED International Multi-Conference on Applied Informatics)",

note = "Proceedings of the IASTED International Conference on Artificial Intelligence and Applications (as part of the 22nd IASTED International Multi-Conference on Applied Informatics ; Conference date: 16-02-2004 Through 18-02-2004",

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Levin, MS & Last, M 2004, Collection of test case sequences: Covering of function cluster digraph. in MH Hamza (ed.), Proceedings of the IASTED International Conference on Artificial Intelligence and Applications (as part of the 22nd IASTED International Multi-Conference on Applied Informatics)., 411-083, Proceedings of the IASTED International Conference. Applied Informatics, pp. 806-810, Proceedings of the IASTED International Conference on Artificial Intelligence and Applications (as part of the 22nd IASTED International Multi-Conference on Applied Informatics, Innsbruck, Austria, 16/02/04.

Collection of test case sequences: Covering of function cluster digraph. / Levin, Mark Sh; Last, Mark.
Proceedings of the IASTED International Conference on Artificial Intelligence and Applications (as part of the 22nd IASTED International Multi-Conference on Applied Informatics). ed. / M.H. Hamza. 2004. p. 806-810 411-083 (Proceedings of the IASTED International Conference. Applied Informatics).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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N2 - The paper focuses on multi-function system testing in the case of multi-stage testing process. In this paper we deal with the problem of covering a digraph of system function clusters by chains (trails) of test cases. The problem is solved by the combinatorial algorithms which include special case algorithms (e.g., tree-like digraph); approximation-based, partitioning-based, and greedy algorithms; and an algorithm based on the maximal matching. Numerical examples illustrate our approach.

AB - The paper focuses on multi-function system testing in the case of multi-stage testing process. In this paper we deal with the problem of covering a digraph of system function clusters by chains (trails) of test cases. The problem is solved by the combinatorial algorithms which include special case algorithms (e.g., tree-like digraph); approximation-based, partitioning-based, and greedy algorithms; and an algorithm based on the maximal matching. Numerical examples illustrate our approach.

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KW - Combinatorial algorithms

KW - Combinatorial optimization

KW - Functional testing

KW - Input-output analysis

KW - System testing

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BT - Proceedings of the IASTED International Conference on Artificial Intelligence and Applications (as part of the 22nd IASTED International Multi-Conference on Applied Informatics)

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Levin MS, Last M. Collection of test case sequences: Covering of function cluster digraph. In Hamza MH, editor, Proceedings of the IASTED International Conference on Artificial Intelligence and Applications (as part of the 22nd IASTED International Multi-Conference on Applied Informatics). 2004. p. 806-810. 411-083. (Proceedings of the IASTED International Conference. Applied Informatics).

Collection of test case sequences: Covering of function cluster digraph

Abstract

Publication series

Conference

Keywords

ASJC Scopus subject areas

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