Comparative study of steel alloys using STM and XRD

M. Brezenitsky; R. Moreh; D. Dayan; G. Kimmel

doi:10.1016/S0925-8388(99)00230-3

Comparative study of steel alloys using STM and XRD

M. Brezenitsky, R. Moreh, D. Dayan, G. Kimmel

Department of Physics

Research output: Contribution to journal › Article › peer-review

4 Scopus citations

Abstract

The STM (Scanning Tunneling Microscope) has been used for characterizing the microstructure of various steel samples by utilizing its surface imaging properties. The subgrain sizes of 15 different samples of steel (in the range 20 nm to 250 nm) were studied by the STM and compared with the results obtained using X-ray diffraction (XRD) by employing line profile analysis of the Bragg peaks. Good agreement was observed between the two sets of data of subgrain sizes. This work establishes STM as a useful characterization tool for studies in metallurgy and metal physics.

Original language	English
Pages (from-to)	257-261
Number of pages	5
Journal	Journal of Alloys and Compounds
Volume	290
Issue number	1-2
DOIs	https://doi.org/10.1016/S0925-8388(99)00230-3
State	Published - 1 Jan 1999

Keywords

Microstructure
Scanning tunneling microscope
Steel

ASJC Scopus subject areas

Mechanics of Materials
Mechanical Engineering
Metals and Alloys
Materials Chemistry

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10.1016/S0925-8388(99)00230-3

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abstract = "The STM (Scanning Tunneling Microscope) has been used for characterizing the microstructure of various steel samples by utilizing its surface imaging properties. The subgrain sizes of 15 different samples of steel (in the range 20 nm to 250 nm) were studied by the STM and compared with the results obtained using X-ray diffraction (XRD) by employing line profile analysis of the Bragg peaks. Good agreement was observed between the two sets of data of subgrain sizes. This work establishes STM as a useful characterization tool for studies in metallurgy and metal physics.",

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AU - Moreh, R.

AU - Dayan, D.

AU - Kimmel, G.

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N2 - The STM (Scanning Tunneling Microscope) has been used for characterizing the microstructure of various steel samples by utilizing its surface imaging properties. The subgrain sizes of 15 different samples of steel (in the range 20 nm to 250 nm) were studied by the STM and compared with the results obtained using X-ray diffraction (XRD) by employing line profile analysis of the Bragg peaks. Good agreement was observed between the two sets of data of subgrain sizes. This work establishes STM as a useful characterization tool for studies in metallurgy and metal physics.

AB - The STM (Scanning Tunneling Microscope) has been used for characterizing the microstructure of various steel samples by utilizing its surface imaging properties. The subgrain sizes of 15 different samples of steel (in the range 20 nm to 250 nm) were studied by the STM and compared with the results obtained using X-ray diffraction (XRD) by employing line profile analysis of the Bragg peaks. Good agreement was observed between the two sets of data of subgrain sizes. This work establishes STM as a useful characterization tool for studies in metallurgy and metal physics.

KW - Microstructure

KW - Scanning tunneling microscope

KW - Steel

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JO - Journal of Alloys and Compounds

JF - Journal of Alloys and Compounds

IS - 1-2

ER -

Comparative study of steel alloys using STM and XRD

Abstract

Keywords

ASJC Scopus subject areas

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