Abstract
The parallel critical field of a stack of superconducting and insulating layers is calculated as a function of the superconducting layer's coherence length ξ and thickness d interlayer coherence length ξ, and insulating thickness s. It is shown that the critical field shows an upturn when the stack crosses over from the strongly coupled or three-dimensional regime (ξ>s+d) to the weakly coupled or two-dimensional regime (ξ<s+d). This upturn is a general property of such stacks, though it is more pronounced when s>d.
Original language | English |
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Pages (from-to) | 1249-1252 |
Number of pages | 4 |
Journal | Physical Review B |
Volume | 17 |
Issue number | 3 |
DOIs | |
State | Published - 1 Jan 1978 |
Externally published | Yes |
ASJC Scopus subject areas
- Condensed Matter Physics