Darkfield Microscopy Enables Virtual Gram Staining of Label-Free Bacteria via Deep Learning

Cagatay Isil; Hatice Ceylan Koydemir; Merve Eryilmaz; Kevin De Haan; Nir Pillar; Koray Mentesoglu; Aras Firat Unal; Yair Rivenson; Sukantha Chandrasekaran; Omai B. Garner; Aydogan Ozcan

Darkfield Microscopy Enables Virtual Gram Staining of Label-Free Bacteria via Deep Learning

Cagatay Isil
, Hatice Ceylan Koydemir
, Merve Eryilmaz
, Kevin De Haan
, Nir Pillar
, Koray Mentesoglu
, Aras Firat Unal
, Yair Rivenson
, Sukantha Chandrasekaran
, Omai B. Garner
, Aydogan Ozcan

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

We report deep learning-enabled virtual Gram staining of label-free bacteria, matching the performance of conventional Gram staining and bypassing the issues related to human errors and chemical staining-related variations.

Original language	English
Title of host publication	2025 Conference on Lasers and Electro-Optics, CLEO 2025
Publisher	Institute of Electrical and Electronics Engineers
ISBN (Electronic)	9781957171500
State	Published - 1 Jan 2025
Externally published	Yes
Event	2025 Conference on Lasers and Electro-Optics, CLEO 2025 - Long Beach, United States Duration: 4 May 2025 → 9 May 2025

Publication series

Name	2025 Conference on Lasers and Electro-Optics, CLEO 2025

Conference

Conference	2025 Conference on Lasers and Electro-Optics, CLEO 2025
Country/Territory	United States
City	Long Beach
Period	4/05/25 → 9/05/25

ASJC Scopus subject areas

Process Chemistry and Technology
Computer Networks and Communications
Civil and Structural Engineering
Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials
Instrumentation

Cite this

Isil, C., Koydemir, H. C., Eryilmaz, M., De Haan, K., Pillar, N., Mentesoglu, K., Unal, A. F., Rivenson, Y., Chandrasekaran, S., Garner, O. B., & Ozcan, A. (2025). Darkfield Microscopy Enables Virtual Gram Staining of Label-Free Bacteria via Deep Learning. In 2025 Conference on Lasers and Electro-Optics, CLEO 2025 (2025 Conference on Lasers and Electro-Optics, CLEO 2025). Institute of Electrical and Electronics Engineers.

@inproceedings{affff3a9724440208737ed052185c529,

title = "Darkfield Microscopy Enables Virtual Gram Staining of Label-Free Bacteria via Deep Learning",

abstract = "We report deep learning-enabled virtual Gram staining of label-free bacteria, matching the performance of conventional Gram staining and bypassing the issues related to human errors and chemical staining-related variations.",

author = "Cagatay Isil and Koydemir, \{Hatice Ceylan\} and Merve Eryilmaz and \{De Haan\}, Kevin and Nir Pillar and Koray Mentesoglu and Unal, \{Aras Firat\} and Yair Rivenson and Sukantha Chandrasekaran and Garner, \{Omai B.\} and Aydogan Ozcan",

note = "Publisher Copyright: {\textcopyright} 2024 The Author(s); 2025 Conference on Lasers and Electro-Optics, CLEO 2025 ; Conference date: 04-05-2025 Through 09-05-2025",

year = "2025",

month = jan,

day = "1",

language = "English",

series = "2025 Conference on Lasers and Electro-Optics, CLEO 2025",

publisher = "Institute of Electrical and Electronics Engineers",

booktitle = "2025 Conference on Lasers and Electro-Optics, CLEO 2025",

address = "United States",

}

Isil, C, Koydemir, HC, Eryilmaz, M, De Haan, K, Pillar, N, Mentesoglu, K, Unal, AF, Rivenson, Y, Chandrasekaran, S, Garner, OB & Ozcan, A 2025, Darkfield Microscopy Enables Virtual Gram Staining of Label-Free Bacteria via Deep Learning. in 2025 Conference on Lasers and Electro-Optics, CLEO 2025. 2025 Conference on Lasers and Electro-Optics, CLEO 2025, Institute of Electrical and Electronics Engineers, 2025 Conference on Lasers and Electro-Optics, CLEO 2025, Long Beach, United States, 4/05/25.

Darkfield Microscopy Enables Virtual Gram Staining of Label-Free Bacteria via Deep Learning. / Isil, Cagatay; Koydemir, Hatice Ceylan; Eryilmaz, Merve et al.
2025 Conference on Lasers and Electro-Optics, CLEO 2025. Institute of Electrical and Electronics Engineers, 2025. (2025 Conference on Lasers and Electro-Optics, CLEO 2025).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Darkfield Microscopy Enables Virtual Gram Staining of Label-Free Bacteria via Deep Learning

AU - Isil, Cagatay

AU - Koydemir, Hatice Ceylan

AU - Eryilmaz, Merve

AU - De Haan, Kevin

AU - Pillar, Nir

AU - Mentesoglu, Koray

AU - Unal, Aras Firat

AU - Rivenson, Yair

AU - Chandrasekaran, Sukantha

AU - Garner, Omai B.

AU - Ozcan, Aydogan

PY - 2025/1/1

Y1 - 2025/1/1

N2 - We report deep learning-enabled virtual Gram staining of label-free bacteria, matching the performance of conventional Gram staining and bypassing the issues related to human errors and chemical staining-related variations.

AB - We report deep learning-enabled virtual Gram staining of label-free bacteria, matching the performance of conventional Gram staining and bypassing the issues related to human errors and chemical staining-related variations.

UR - https://www.scopus.com/pages/publications/105021462704

M3 - Conference contribution

AN - SCOPUS:105021462704

T3 - 2025 Conference on Lasers and Electro-Optics, CLEO 2025

BT - 2025 Conference on Lasers and Electro-Optics, CLEO 2025

PB - Institute of Electrical and Electronics Engineers

T2 - 2025 Conference on Lasers and Electro-Optics, CLEO 2025

Y2 - 4 May 2025 through 9 May 2025

ER -

Darkfield Microscopy Enables Virtual Gram Staining of Label-Free Bacteria via Deep Learning

Abstract

Publication series

Conference

ASJC Scopus subject areas

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