Deep Learning Microscopy: Enhancing Resolution, Field-of-View and Depth-of-Field of Optical Microscopy Images Using Neural Networks

Yair Rivenson; Zoltan Gorocs; Harun Gunaydin; Yibo Zhang; Hongda Wang; Aydogan Ozcan

Deep Learning Microscopy: Enhancing Resolution, Field-of-View and Depth-of-Field of Optical Microscopy Images Using Neural Networks

Yair Rivenson
, Zoltan Gorocs
, Harun Gunaydin
, Yibo Zhang
, Hongda Wang
, Aydogan Ozcan

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

We demonstrate the ability of deep convolutional neural networks to significantly enhance the spatial resolution, field-of-view and depth-of-field of optical microscopy images, without any hardware modification to the imaging system.

Original language	English
Title of host publication	2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings
Publisher	Institute of Electrical and Electronics Engineers
ISBN (Print)	9781943580422
State	Published - 6 Aug 2018
Externally published	Yes
Event	2018 Conference on Lasers and Electro-Optics, CLEO 2018 - San Jose, United States Duration: 13 May 2018 → 18 May 2018

Publication series

Name	2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings

Conference

Conference	2018 Conference on Lasers and Electro-Optics, CLEO 2018
Country/Territory	United States
City	San Jose
Period	13/05/18 → 18/05/18

ASJC Scopus subject areas

Instrumentation
Atomic and Molecular Physics, and Optics

Cite this

Rivenson, Y., Gorocs, Z., Gunaydin, H., Zhang, Y., Wang, H., & Ozcan, A. (2018). Deep Learning Microscopy: Enhancing Resolution, Field-of-View and Depth-of-Field of Optical Microscopy Images Using Neural Networks. In 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings Article 8426258 (2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings). Institute of Electrical and Electronics Engineers.

Rivenson, Yair ; Gorocs, Zoltan ; Gunaydin, Harun et al. / Deep Learning Microscopy : Enhancing Resolution, Field-of-View and Depth-of-Field of Optical Microscopy Images Using Neural Networks. 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings. Institute of Electrical and Electronics Engineers, 2018. (2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings).

@inproceedings{8bc91cb5896642709812ecf3aa65d0a0,

title = "Deep Learning Microscopy: Enhancing Resolution, Field-of-View and Depth-of-Field of Optical Microscopy Images Using Neural Networks",

abstract = "We demonstrate the ability of deep convolutional neural networks to significantly enhance the spatial resolution, field-of-view and depth-of-field of optical microscopy images, without any hardware modification to the imaging system.",

author = "Yair Rivenson and Zoltan Gorocs and Harun Gunaydin and Yibo Zhang and Hongda Wang and Aydogan Ozcan",

note = "Publisher Copyright: {\textcopyright} 2018 OSA.; 2018 Conference on Lasers and Electro-Optics, CLEO 2018 ; Conference date: 13-05-2018 Through 18-05-2018",

year = "2018",

month = aug,

day = "6",

language = "English",

isbn = "9781943580422",

series = "2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings",

publisher = "Institute of Electrical and Electronics Engineers",

booktitle = "2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings",

address = "United States",

}

Rivenson, Y, Gorocs, Z, Gunaydin, H, Zhang, Y, Wang, H & Ozcan, A 2018, Deep Learning Microscopy: Enhancing Resolution, Field-of-View and Depth-of-Field of Optical Microscopy Images Using Neural Networks. in 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings., 8426258, 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings, Institute of Electrical and Electronics Engineers, 2018 Conference on Lasers and Electro-Optics, CLEO 2018, San Jose, United States, 13/05/18.

Deep Learning Microscopy: Enhancing Resolution, Field-of-View and Depth-of-Field of Optical Microscopy Images Using Neural Networks. / Rivenson, Yair; Gorocs, Zoltan; Gunaydin, Harun et al.
2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings. Institute of Electrical and Electronics Engineers, 2018. 8426258 (2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Deep Learning Microscopy

T2 - 2018 Conference on Lasers and Electro-Optics, CLEO 2018

AU - Rivenson, Yair

AU - Gorocs, Zoltan

AU - Gunaydin, Harun

AU - Zhang, Yibo

AU - Wang, Hongda

AU - Ozcan, Aydogan

PY - 2018/8/6

Y1 - 2018/8/6

N2 - We demonstrate the ability of deep convolutional neural networks to significantly enhance the spatial resolution, field-of-view and depth-of-field of optical microscopy images, without any hardware modification to the imaging system.

AB - We demonstrate the ability of deep convolutional neural networks to significantly enhance the spatial resolution, field-of-view and depth-of-field of optical microscopy images, without any hardware modification to the imaging system.

UR - https://www.scopus.com/pages/publications/85052596393

M3 - Conference contribution

AN - SCOPUS:85052596393

SN - 9781943580422

T3 - 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings

BT - 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings

PB - Institute of Electrical and Electronics Engineers

Y2 - 13 May 2018 through 18 May 2018

ER -

Rivenson Y, Gorocs Z, Gunaydin H, Zhang Y, Wang H, Ozcan A. Deep Learning Microscopy: Enhancing Resolution, Field-of-View and Depth-of-Field of Optical Microscopy Images Using Neural Networks. In 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings. Institute of Electrical and Electronics Engineers. 2018. 8426258. (2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings).

Deep Learning Microscopy: Enhancing Resolution, Field-of-View and Depth-of-Field of Optical Microscopy Images Using Neural Networks

Abstract

Publication series

Conference

ASJC Scopus subject areas

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