Deep learning microscopy: Enhancing resolution, field-of- view and depth-of-field of optical microscopy images using neural networks

  • Yair Rivenson
  • , Zoltán Göröcs
  • , Harun Günaydin
  • , Yibo Zhang
  • , Hongda Wang
  • , Aydogan Ozcan

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

We demonstrate the ability of deep convolutional neural networks to significantly enhance the spatial resolution, field-of-view and depth-of-field of optical microscopy images, without any hardware modification to the imaging system.

Original languageEnglish
Title of host publicationCLEO
Subtitle of host publicationApplications and Technology, CLEO_AT 2018
PublisherOptica Publishing Group (formerly OSA)
ISBN (Print)9781943580422
DOIs
StatePublished - 1 Jan 2018
Externally publishedYes
EventCLEO: Applications and Technology, CLEO_AT 2018 - San Jose, United States
Duration: 13 May 201818 May 2018

Publication series

NameOptics InfoBase Conference Papers
VolumePart F92-CLEO_AT 2018
ISSN (Electronic)2162-2701

Conference

ConferenceCLEO: Applications and Technology, CLEO_AT 2018
Country/TerritoryUnited States
CitySan Jose
Period13/05/1818/05/18

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials

Fingerprint

Dive into the research topics of 'Deep learning microscopy: Enhancing resolution, field-of- view and depth-of-field of optical microscopy images using neural networks'. Together they form a unique fingerprint.

Cite this