Deposition and structural characterization of high quality textured C₆₀ thin films

Keyphrases

• Structural Characterization 100%
• C60 Films 100%
• Nanoscopic 50%
• Crystalline Structure 50%
• Atomic Force Microscopy 50%
• X Ray Diffraction 50%
• Vacuum Deposition Methods 50%
• Glass Substrate 50%
• First-order Phase Transition 50%
• Angstrom 50%
• Au Substrate 50%
• Selective Deposition 50%
• Scanning Tunneling Microscopy 50%
• Au Layer 50%
• Ag Layer 50%
• Ag Substrate 50%

Material Science

• Film 100%
• Thin Films 100%
• X-Ray Diffraction 66%
• Crystal Structure 33%
• Vacuum Deposition 33%