Depth-resolved nanoscopic single particle tracking based on fluorescence phase-shifting interferometry

Elad Arbel, Alberto Bilenca

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We propose and analyze the use of fluorescence phase-shifting interferometric (PSI) imaging for single particle tracking along 1 μm-depth (z) trajectories. While spatial PSI using a single camera attains a maximal twofold improvement in the z-localization precision compared to temporal PSI for <0.1 μm2/s diffusion, temporal PSI shows a fourfold larger field-of-view.

Original languageEnglish
Title of host publicationCLEO
PublisherInstitute of Electrical and Electronics Engineers
ISBN (Print)9781557529725
DOIs
StatePublished - 18 Nov 2013
EventCLEO: Science and Innovations, CLEO_SI 2013 - San Jose, CA, United States
Duration: 9 Jun 201314 Jun 2013

Publication series

NameCLEO: Science and Innovations, CLEO_SI 2013

Conference

ConferenceCLEO: Science and Innovations, CLEO_SI 2013
Country/TerritoryUnited States
CitySan Jose, CA
Period9/06/1314/06/13

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics

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