Derivation of Single-Stage Attribute Sampling Plans With One of the p's Larger Than 0.5

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Abstract

A graphical trial-and-error approach has been outlined for the derivation of single-stage attribute acceptance-sampling plans in which either the Acceptable Quality Level or the Lot, Tolerance Fraction Defective is larger than 0.5. The solution procedure tlses Larson's nomograph of the cumulative binomial distribution. A numerical example is provided.

Original languageEnglish
Pages (from-to)99-100
Number of pages2
JournalTechnometrics
Volume19
Issue number1
DOIs
StatePublished - 1 Jan 1977

Keywords

  • Acceptance sampling
  • Compressed limit gauging samplitig plaus
  • Cumulative binomial distribution
  • Lawon's nomograph
  • Sampling plans

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