Abstract
Compressed limit gaging sampling plans, developed in order to reduce the sample size of an attribute plan, are based on the same probabilities for fraction defectives as the variables plan. They seem not to be utilized to their full potential due to the arbitrary selection of the fictitious specification limit. A rapid graphical trial-and-error procedure is given for generating a compressed limit gaging sampling plan with the smallest possible sample size using an expanded version of Larson's nomograph of the cumulative binomial distribution.
| Original language | English |
|---|---|
| Pages (from-to) | 225-231 |
| Number of pages | 7 |
| Journal | Journal of Quality Technology |
| Volume | 8 |
| Issue number | 4 |
| DOIs | |
| State | Published - 1 Jan 1976 |
ASJC Scopus subject areas
- Safety, Risk, Reliability and Quality
- Strategy and Management
- Management Science and Operations Research
- Industrial and Manufacturing Engineering