Determination of parameters relevant to alpha spectrometry when employing source coating

N. Vainblat; O. Pelled; U. German; G. Haquin; A. Tshuva; Z. B. Alfassi

doi:10.1016/j.apradiso.2004.03.026

Determination of parameters relevant to alpha spectrometry when employing source coating

N. Vainblat, O. Pelled, U. German, G. Haquin, A. Tshuva, Z. B. Alfassi

Unit of Nuclear Engineering

Research output: Contribution to journal › Conference article › peer-review

18 Scopus citations

Abstract

The recoil fragments from an alpha-emitting source may cause significant detector contamination. The simplest method to avoid the problem is to use a source coating. The influence of Mylar film coatings of different thickness on the resolution, efficiency and minimum detection level of an alpha spectrometry system was investigated. No significant deterioration of the system characteristics was observed when using thin films of about 0.25mg/cm ².

Original language	English
Pages (from-to)	307-311
Number of pages	5
Journal	Applied Radiation and Isotopes
Volume	61
Issue number	2-3
DOIs	https://doi.org/10.1016/j.apradiso.2004.03.026
State	Published - 1 Aug 2004
Event	Low Level Radionuclide Measurement Techniques - Vienna, Austria Duration: 13 Oct 2003 → 17 Oct 2003

Keywords

Alpha spectrometry
Coating
Efficiency
Minimum level of detection
Resolution

ASJC Scopus subject areas

Radiation

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10.1016/j.apradiso.2004.03.026

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title = "Determination of parameters relevant to alpha spectrometry when employing source coating",

abstract = "The recoil fragments from an alpha-emitting source may cause significant detector contamination. The simplest method to avoid the problem is to use a source coating. The influence of Mylar film coatings of different thickness on the resolution, efficiency and minimum detection level of an alpha spectrometry system was investigated. No significant deterioration of the system characteristics was observed when using thin films of about 0.25mg/cm 2.",

keywords = "Alpha spectrometry, Coating, Efficiency, Minimum level of detection, Resolution",

author = "N. Vainblat and O. Pelled and U. German and G. Haquin and A. Tshuva and Alfassi, {Z. B.}",

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T1 - Determination of parameters relevant to alpha spectrometry when employing source coating

AU - Vainblat, N.

AU - Pelled, O.

AU - German, U.

AU - Haquin, G.

AU - Tshuva, A.

AU - Alfassi, Z. B.

PY - 2004/8/1

Y1 - 2004/8/1

N2 - The recoil fragments from an alpha-emitting source may cause significant detector contamination. The simplest method to avoid the problem is to use a source coating. The influence of Mylar film coatings of different thickness on the resolution, efficiency and minimum detection level of an alpha spectrometry system was investigated. No significant deterioration of the system characteristics was observed when using thin films of about 0.25mg/cm 2.

AB - The recoil fragments from an alpha-emitting source may cause significant detector contamination. The simplest method to avoid the problem is to use a source coating. The influence of Mylar film coatings of different thickness on the resolution, efficiency and minimum detection level of an alpha spectrometry system was investigated. No significant deterioration of the system characteristics was observed when using thin films of about 0.25mg/cm 2.

KW - Alpha spectrometry

KW - Coating

KW - Efficiency

KW - Minimum level of detection

KW - Resolution

UR - http://www.scopus.com/inward/record.url?scp=2942612230&partnerID=8YFLogxK

U2 - 10.1016/j.apradiso.2004.03.026

DO - 10.1016/j.apradiso.2004.03.026

M3 - Conference article

AN - SCOPUS:2942612230

SN - 0969-8043

VL - 61

SP - 307

EP - 311

JO - Applied Radiation and Isotopes

JF - Applied Radiation and Isotopes

IS - 2-3

T2 - Low Level Radionuclide Measurement Techniques

Y2 - 13 October 2003 through 17 October 2003

ER -

Determination of parameters relevant to alpha spectrometry when employing source coating

Abstract

Keywords

ASJC Scopus subject areas

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