Determination of parameters relevant to alpha spectrometry when employing source coating

N. Vainblat, O. Pelled, U. German, G. Haquin, A. Tshuva, Z. B. Alfassi

Research output: Contribution to journalConference articlepeer-review

16 Scopus citations

Abstract

The recoil fragments from an alpha-emitting source may cause significant detector contamination. The simplest method to avoid the problem is to use a source coating. The influence of Mylar film coatings of different thickness on the resolution, efficiency and minimum detection level of an alpha spectrometry system was investigated. No significant deterioration of the system characteristics was observed when using thin films of about 0.25mg/cm 2.

Original languageEnglish
Pages (from-to)307-311
Number of pages5
JournalApplied Radiation and Isotopes
Volume61
Issue number2-3
DOIs
StatePublished - 1 Aug 2004
EventLow Level Radionuclide Measurement Techniques - Vienna, Austria
Duration: 13 Oct 200317 Oct 2003

Keywords

  • Alpha spectrometry
  • Coating
  • Efficiency
  • Minimum level of detection
  • Resolution

ASJC Scopus subject areas

  • Radiation

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