Dielectric permittivity imaging based on a liquid crystal capacitive sensor

Amir Aizen, Ibrahim Abdulhalim

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

A method and system for imaging objects based on sensing their dielectric permittivity at low frequencies of few kHz are presented. The system is composed of three regions: Liquid Crystal (LC) layer, buffer layer and a cavity in which the analyzed samples are inserted. When a voltage is applied, it falls partially on the LC causing its molecules to tilt. The amount and distribution of the voltage depend on the dielectric permittivity of the analyzed samples. The permittivity distribution is imaged by reading the retardation changes in the LC with visible light in reflection and transmission modes. The resolution limit of the system is predicted theoretically using rigorous simulation showing possible resolution down to few tens of microns.

Original languageEnglish
Title of host publicationLiquid Crystals XXI
EditorsIam Choon Khoo
PublisherSPIE
ISBN (Electronic)9781510611795
DOIs
StatePublished - 1 Jan 2017
EventLiquid Crystals XXI 2017 - San Diego, United States
Duration: 6 Aug 20177 Aug 2017

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume10361
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceLiquid Crystals XXI 2017
Country/TerritoryUnited States
CitySan Diego
Period6/08/177/08/17

Keywords

  • Liquid Crystal devices
  • Relative Permittivity imaging

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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