The direct characterization of a single grain boundary (GB) and a single grain surface in solar cell-quality CdTe was performed using scanning probe microscopy. It was found that scanning capacitance microscopy could be used to study polycrystalline electronic materials. The presence of a barrier for hole transport across GB in solar-cell quality CdTe was also observed.
|Number of pages||3|
|Journal||Applied Physics Letters|
|State||Published - 27 Jan 2003|
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)