Direct evidence for grain-boundary depletion in polycrystalline CdTe from nanoscale-resolved measurements

Iris Visoly-Fisher, Sidney R. Cohen, David Cahen

Research output: Contribution to journalArticlepeer-review

87 Scopus citations

Abstract

The direct characterization of a single grain boundary (GB) and a single grain surface in solar cell-quality CdTe was performed using scanning probe microscopy. It was found that scanning capacitance microscopy could be used to study polycrystalline electronic materials. The presence of a barrier for hole transport across GB in solar-cell quality CdTe was also observed.

Original languageEnglish
Pages (from-to)556-558
Number of pages3
JournalApplied Physics Letters
Volume82
Issue number4
DOIs
StatePublished - 27 Jan 2003
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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