Abstract
The direct characterization of a single grain boundary (GB) and a single grain surface in solar cell-quality CdTe was performed using scanning probe microscopy. It was found that scanning capacitance microscopy could be used to study polycrystalline electronic materials. The presence of a barrier for hole transport across GB in solar-cell quality CdTe was also observed.
Original language | English |
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Pages (from-to) | 556-558 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 82 |
Issue number | 4 |
DOIs | |
State | Published - 27 Jan 2003 |
Externally published | Yes |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)