Abstract
Incorporation of catalyst atoms during the growth process of semiconductor nanowires reduces the electron mean free path and degrades their electronic properties. Aberration-corrected scanning transmission electron microscopy (STEM) is now capable of directly imaging single Au atoms within the dense matrix of a GaAs crystal, by slightly tilting the GaAs lattice planes with respect to the incident electron beam. Au doping values in the order of 10 17-18 cm 3 were measured, making ballistic transport through the nanowires practically inaccessible.
| Original language | English |
|---|---|
| Pages (from-to) | 2352-2356 |
| Number of pages | 5 |
| Journal | Nano Letters |
| Volume | 12 |
| Issue number | 5 |
| DOIs | |
| State | Published - 9 May 2012 |
Keywords
- Single atom detection
- dopants
- nanowires
- scanning transmission electron microscopy
- transport phenomena
ASJC Scopus subject areas
- Bioengineering
- General Chemistry
- General Materials Science
- Condensed Matter Physics
- Mechanical Engineering