Direct measurement of minority carriers diffusion length using Kelvin probe force microscopy

T. Meoded, R. Shikler, N. Fried, Y. Rosenwaks

Research output: Contribution to journalArticlepeer-review

49 Scopus citations

Fingerprint

Dive into the research topics of 'Direct measurement of minority carriers diffusion length using Kelvin probe force microscopy'. Together they form a unique fingerprint.

Keyphrases

Engineering

Material Science