Direct measurement of minority carriers diffusion length using Kelvin probe force microscopy

Keyphrases

• Direct Measurement 100%
• Scanning Kelvin Probe Force Microscopy (SKPFM) 100%
• Minority Carrier Diffusion Length 100%
• Contact Potential Difference 100%
• Diffusion Length 50%
• Semiconductors 50%
• Atomic Force Microscope 50%
• Semiconductor Junctions 50%
• Electron Diffusion Coefficient 50%
• Surface Photovoltage 50%
• Epilayer 50%
• Photogenerated Carriers 50%
• Minority Carriers 50%
• Continuity Equation 50%

Engineering

• Minority Carriers 100%
• Carrier Diffusion Length 100%
• Potential Difference 66%
• Diffusion Length 33%
• Atomic Force Microscope 33%
• Surface Photovoltage 33%
• Length (L) 33%
• Photogenerated Carrier 33%
• Electron Diffusion Length 33%
• Continuity Equation 33%

Material Science

• Epilayers 100%