Disorder/order phase transition in C60 thin films studied by surface photovoltage spectroscopy

E. A. Katz, D. Faiman, B. Mishori, Yoram Shapira, A. Isakina, M. A. Strzhemechny

Research output: Contribution to journalArticlepeer-review

8 Scopus citations

Abstract

The electronic properties of disorder/order phase transition in C 60 thin films were studied using surface photovoltage (SPV) spectroscopy at 120-300 k. The thin films were deposited on a substrate of optical glass predeposited with a silver layer using vacuum deposition technique. The atomic force microscopy (AFM) was used to study the morphology of the front surface of the films. The results show that the energy position of the thresholds exhibited nonmonotonic behavior with a mirror symmetry.

Original languageEnglish
Pages (from-to)7173-7177
Number of pages5
JournalJournal of Applied Physics
Volume94
Issue number11
DOIs
StatePublished - 1 Dec 2003

ASJC Scopus subject areas

  • Physics and Astronomy (all)

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